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Planar pixel sensors for the ATLAS upgrade: beam tests results - IOPscience

Planar pixel sensors for the ATLAS upgrade: beam tests results

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Published 31 October 2012 Published under licence by IOP Publishing Ltd
, , Citation J Weingarten et al 2012 JINST 7 P10028 DOI 10.1088/1748-0221/7/10/P10028

1748-0221/7/10/P10028

Abstract

The performance of planar silicon pixel sensors, in development for the ATLAS Insertable B-Layer and High Luminosity LHC (HL-LHC) upgrades, has been examined in a series of beam tests at the CERN SPS facilities since 2009. Salient results are reported on the key parameters, including the spatial resolution, the charge collection and the charge sharing between adjacent cells, for different bulk materials and sensor geometries. Measurements are presented for n+-in-n pixel sensors irradiated with a range of fluences and for p-type silicon sensors with various layouts from different vendors. All tested sensors were connected via bump-bonding to the ATLAS Pixel read-out chip. The tests reveal that both n-type and p-type planar sensors are able to collect significant charge even after the lifetime fluence expected at the HL-LHC.

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10.1088/1748-0221/7/10/P10028