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Phys. Rev. Lett. 107, 123602 (2011) - Scanning Emitter Lifetime Imaging Microscopy for Spontaneous Emission Control
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Scanning Emitter Lifetime Imaging Microscopy for Spontaneous Emission Control

Martin Frimmer, Yuntian Chen, and A. Femius Koenderink
Phys. Rev. Lett. 107, 123602 – Published 16 September 2011

Abstract

We report an experimental technique to map and exploit the local density of optical states of arbitrary planar nanophotonic structures. The method relies on positioning a spontaneous emitter attached to a scanning probe deterministically and reversibly with respect to its photonic environment while measuring its lifetime. We demonstrate the method by imaging the enhancement of the local density of optical states around metal nanowires. By nanopositioning, the decay rate of a pointlike source of fluorescence can be reversibly and repeatedly changed by a factor of 2 by coupling it to the guided plasmonic mode of the wire.

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  • Received 10 April 2011

DOI:https://doi.org/10.1103/PhysRevLett.107.123602

© 2011 American Physical Society

Authors & Affiliations

Martin Frimmer1,*, Yuntian Chen2, and A. Femius Koenderink1

  • 1Center for Nanophotonics, FOM Institute for Atomic and Molecular Physics, Science Park 104, 1098 XG Amsterdam, The Netherlands
  • 2DTU Fotonik, Department of Photonics Engineering, Ørsteds Plads, Building 343, DK-2800 Kongens Lyngby, Denmark

  • *frimmer@amolf.nl URL: http://www.amolf.nl/

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Vol. 107, Iss. 12 — 16 September 2011

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