(Translated by https://www.hiragana.jp/)
{"created":"2022-05-13T06:32:57.918348+00:00","id":2002735,"links":{},"metadata":{"_buckets":{"deposit":"f3c03aaf-0860-4c6a-bd27-0d6197d78781"},"_deposit":{"created_by":17,"id":"2002735","owner":"17","owners":[17],"pid":{"revision_id":0,"type":"depid","value":"2002735"},"status":"published"},"_oai":{"id":"oai:nagoya.repo.nii.ac.jp:02002735","sets":["312:598:599"]},"author_link":[],"control_number":"2002735","item_1615768549627":{"attribute_name":"出版しゅっぱんタイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_9_biblio_info_6":{"attribute_name":"書誌しょし情報じょうほう","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-07","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"1265","bibliographicPageStart":"1260","bibliographic_titles":[{"bibliographic_title":"2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)","bibliographic_titleLang":"en"}]}]},"item_9_description_4":{"attribute_name":"内容ないよう記述きじゅつ","attribute_value_mlt":[{"subitem_description":"This work proposes a design methodology that saves the power under voltage over-scaling (VOS) operation. The key idea of the proposed design methodology is to combine critical path isolation (CPI) and bit-width scaling (BWS) under the constraint of computational quality, e.g., Peak Signal-to-Noise Ratio (PSNR). Conventional CPI inherently cannot reduce the delay of intrinsic critical paths (CPs), which may significantly restrict the power saving effect. On the other hand, the proposed methodology tries to reduce both intrinsic and non-intrinsic CPs. Therefore, our design dramatically reduces the supply voltage and power dissipation while satisfying the quality constraint. Moreover, for reducing co-design exploration space, the proposed methodology utilizes the exclusiveness of the paths targeted by CPI and BWS, where CPI aims at reducing the minimum supply voltage of non-intrinsic CP, and BWS focuses on intrinsic CPs in arithmetic units. From this key exclusiveness, the proposed design splits the simultaneous optimization problem into three sub-problems; (1) the determination of bit-width reduction, (2) the timing optimization for non-intrinsic CPs, and (3) investigating the minimum supply voltage of the BWS and CPI-applied circuit under quality constraint, for reducing power dissipation. Thanks to the problem splitting, the proposed methodology can efficiently find quality-constrained minimum-power design. Evaluation results show that CPI and BWS are highly compatible, and they significantly enhance the efficacy of VOS. In a case study of GPGPU processor, the proposed design saves the power dissipation by 42.7% for an image processing and by 51.2% for a neural network inference workload.","subitem_description_language":"en","subitem_description_type":"Abstract"},{"subitem_description":"DATE 21. 1-5 Feb. 2021. Grenoble, France (Virtual)","subitem_description_language":"en","subitem_description_type":"Other"}]},"item_9_publisher_32":{"attribute_name":"出版しゅっぱん者しゃ","attribute_value_mlt":[{"subitem_publisher":"IEEE","subitem_publisher_language":"en"}]},"item_9_relation_43":{"attribute_name":"関連かんれん情報じょうほう","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.23919/DATE51398.2021.9473946","subitem_relation_type_select":"DOI"}},{"subitem_relation_type":"isPartOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"978-1-7281-6336-9","subitem_relation_type_select":"ISBN"}}]},"item_9_rights_12":{"attribute_name":"権利けんり","attribute_value_mlt":[{"subitem_rights":"“© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.”","subitem_rights_language":"en"}]},"item_9_source_id_7":{"attribute_name":"収録しゅうろく物ぶつ識別子しきべつし","attribute_value_mlt":[{"subitem_source_identifier":"1530-1591","subitem_source_identifier_type":"PISSN"}]},"item_access_right":{"attribute_name":"アクセス権けん","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者ちょしゃ","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Masuda, Yutaka","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Nagayama, Jun","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Cheng, TaiYu","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Ishihara, Tohru","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Momiyama, Yoichi","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Hashimoto, Masanori","creatorNameLang":"en"}]}]},"item_files":{"attribute_name":"ファイル情報じょうほう","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2022-05-13"}],"displaytype":"detail","filename":"DATE_Masuda_submit.pdf","filesize":[{"value":"344 KB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://nagoya.repo.nii.ac.jp/record/2002735/files/DATE_Masuda_submit.pdf"},"version_id":"6956d39d-8d7f-4309-b432-1a9d66e9ced8"}]},"item_language":{"attribute_name":"言語げんご","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源しげんタイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design","subitem_title_language":"en"}]},"item_type_id":"40001","owner":"17","path":["599"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2022-05-13"},"publish_date":"2022-05-13","publish_status":"0","recid":"2002735","relation_version_is_last":true,"title":["Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design"],"weko_creator_id":"17","weko_shared_id":-1},"updated":"2023-01-16T04:28:16.938294+00:00"}