High resolution imaging
JI Goldstein, DE Newbury, JR Michael… - … Electron Microscopy and …, 2018 - Springer
… the SEM performance … “Working at higher magnifications in scanning electron microscopy
with secondary and backscattered electrons on metal coated biological specimens” SEM/1985. …
with secondary and backscattered electrons on metal coated biological specimens” SEM/1985. …
[HTML][HTML] Critical issues in scanning electron microscope metrology
MT Postek - Journal of research of the National Institute of …, 1994 - ncbi.nlm.nih.gov
… to be directly incorporated into the SEM electronics console as a standard component by the
SEM … Peters [79] has measured the components of the secondary electron signal from gold …
SEM … Peters [79] has measured the components of the secondary electron signal from gold …