Microscopy - Books

Metallographer's Guide: Practices and Procedures for Irons and Steels

This book provides clearly written explanations of important concepts, and step-by-step instructions for equipment selection and use, microscopy techniques, specimen preparation, and etching. Dozens of concise and helpful "metallographic tips" are included in the chapters on laboratory practices and specimen preparation. The book features over 500 representative microstructures, with discussions of how the structures can be altered by heat treatment and other means. A handy index to these images is provided, so the book can also be used as an atlas of iron and steel microstructures.

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Interface Engineering of Natural Fibre Composites

One of the major reasons for composite failure is a breakdown of the bond between the reinforcement fibres and the matrix. When this happens, the composite loses strength and fails. By engineering the interface between the natural fibres and the matrix, the properties of the composite can be manipulated to give maximum performance. Interface engineering of natural fibre composites for maximum performance looks at natural (sustainable) fibre composites and the growing trend towards their use as reinforcements in composites.

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ASM Handbook Volume 9: Metallography and Microstructures

Metallography and Microstructures, Volume 9 of the ASM Handbook, is an essential reference for anyone who specifies, performs, monitors, evaluates, or uses metallurgical analyses for production quality control, research, or educational training. The new edition is a comprehensive reference that features over 30 new articles with substantive updates on metallographic techniques and microstructural interpretation.

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Scanning Probe Microscopy

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication.

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Scanning Microscopy for Nanotechnology

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM).

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Metallography: Principles and Practice

Offering a comprehensive source of information on metallographic techniques and their application to the study of metals, ceramics, and polymers, this work is available once again from ASM. It contains an extensive collection of micro- and macrographs. This proven reference for metallographers, engineers, technicians has also been found useful by students studying physical metallurgy, metallography and materials science.

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Applied Scanning Probe Methods VII

The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments.

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Springer Handbook of Nanotechnology

Since 2004 the Springer Handbook of Nanotechnology has established itself as the definitive reference in the nanoscience and nanotechnology area. It integrates the knowledge from nanofabrication, nanodevices, nanomechanics, Nanotribology, materials science, and reliability engineering in just one volume.

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Fundamentals of Friction and Wear

In the past twenty years, powerful tools such as atomic force microscopy have made it possible to accurately investigate the phenomena of friction and wear, down to the nanometer scale. Readers of this book will become familiar with the concepts and techniques of nanotribology, explained by an international team of scientists and engineers, actively involved and with long experience in this field.

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Light Microscopy of Carbon Steels

This "how to" book not only gives everyday working examples, but also discusses the relationship between the constitution, properties, and microstructure of various carbon steel products.

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Science of Microscopy

In Science of Microscopy, comprehensive reviews set innovations in the context of microscopy today. Each contribution presents a form of microscopy or occasionally a microscopic technique, and provides information about the instruments involved and their areas of application. The contributions are written in such a way that the reader can understand how the various instruments function, their strengths and weaknesses, and whether they are suitable for a particular scientific investigation. Science of Microscopy will be an indispensable guide to both a wide range of scientists in university laboratories and to engineers and scientists in industrial R&D; departments.

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ASM Handbook Volume 12: Fractography

Provides engineers with enhanced capability for recognizing and interpreting the various features of a fracture, enabling you to perform improved failure analyses and to better determine the relationship of the fracture mode to the microstructure.

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Applied Scanning Probe Methods VI

The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments.

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Applied Scanning Probe Methods V

The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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Microscopy Books

Materials/Engineering Books by Subject Matter