Atomic Force Microscopes (AFM)

Atomic force microscopes (AFM) are extremely high-resolution scanning probe microscopes, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Applications of AFM and other types of scanning probe microscopy continue to grow rapidly in number and include biological materials (e.g., studying DNA structure), polymeric materials (e.g., studying morphology, mechanical response, and thermal transitions), and semiconductors (e.g., detecting defects). In particular, AFM can be utilized to evaluate the surface quality of products such as contact lenses, optical components (mirrors, beamsplitters, etc.), and semiconductor wafers after various cleaning, etching, or other manufacturing processes.

Equipment

Park Systems XE-70 Atomic Force Microscope

An economic extension of the XE-100, the XE-70 is Park Systems’ new AFM solution for budget conscious customers. Having a compact mechanical design, the XE-70 continues the innovative technology of the XE-series that sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as all other systems in the XE product line.

Solver NEXT Scanning Probe Microscope from NT-MDT

The Solver Next is the first to offer a new concept in general purpose SPM. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time. The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements.

Park Systems XE-Bio Atomic Force Microscope

The XE-Bio is an innovative yet user-friendly Atomic Force Microscope designed specifically for biomedical and other advanced life science research. The modular design of the XE-Bio provides the user with a wide array of imaging modes including the revolutionary Scanning Ion Conductance Microscopy (SICM) module.

VITA - Veeco Instruments Thermal Analysis

VITA (Veeco Instruments Thermal Analysis) technology adds high resolution thermal characterization capabilities to existing Veeco Scanning Probe Microscopes (SPM). Now SPM users not only benefit from unmatched core performance, but can add a traditional bulk characterization technique.

alpha500 Confocal Raman Microscope with Automated 3-D Chemical Imaging and Surface Inspection from Witec

The WITec alpha500 is the first instrument on the market to combine Confocal Raman Microscopy for 3-D Chemical Imaging and Atomic Force Microscopy for high resolution structural imaging in an automated system.

5500 Atomic Force Microscope (AFM) by Agilent Technologies

The Agilent 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Agilent Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.

Ambios Q-Scope Series Atomic Force Microscope

Designed to deliver an SPM platform which can grow and adapt to changing research needs, the Ambios Q-ScopeTM delivers long-term value as well as excellent imaging performance and high resolution measurements. Our modular approach to building your system minimizes cost, offers maximum flexibility, and allows custom configurations for special applications. Electronic control signal levels are available to all users via back-panel BNC access.

alpha300 A Atomic Force Microscope from Witec

The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors.

VEECO InSight 3DAFM - Atomic Force Microscope

The InSight™ 3D Atomic Force Microscope (AFM) provides unparalleled accuracy and precision that is required for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features. Veeco's new Insight 3D AFM provides the lowest measurement uncertainty for critical dimension (CD) and sidewall angle (SWA) metrology, which directly leads to improved process control.

Dimension Icon Atomic Force Microscope from Veeco

The Dimension Icon Atomic Force Microscope (AFM) from Veeco brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility. The Icon has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours, enabling increased productivity.

True Surface Microscopy from Witec

WITec's new True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those points that are in focus contribute to the image.

Novascan ESPM 3D Atomic Force Microscope

The ESPM 3D is a specialized atomic force microscope designed for biological, material science and nanoscience applications. Its design allows for stand alone applications as well as easy intregation with other instruments such as confocal microscopes, spectral confocal microscopes, inverted optical microscopes, laser traps and other optical instruments. In addition, our scientists can help you to custom integrate or design a scanning probe microscope system that is specific to your application or group, saving you precious time and resources.

N8 NEOS SENTERRA - Combination AFM and Raman Spectroscopy

The N8 NEOS SENTERRA combines the flexibility of the Raman with intuitive AFM control.

NanoEducator Platform from NT-MDT

We believe that future scientific breakthroughs have their origins in the present. Following that truth, we have developed a special student-orientated product: NanoEducator. More than a simple SPM, NanoEducator opens the door to nanotechnology education. We've designed it to be cost effective enough to equip a classroom with SPMs, complete with e-teach software, handbooks, and descriptive laboratory exercises - all the materials necessary to teach students crucial skills in nanotechnology.

The Cypher AFM from Asylum Research

The Cypher AFM/SPM from Asylum Research is the first totally new small sample AFM/SPM in over a decade. The all new design gives the Cypher increased capabilities, more control, more functionality, more modularity, and more resolution – all with striking ease of use.

6000ILM Atomic Force Microscope (AFM) from Agilent Technologies

The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope with those of an inverted light microscope or a confocal microscope, letting life science researchers go beyond the optical diffraction limit to achieve nanoscale resolution without any special sample preparation. It is ideal for studying cell membranes, the surface structure of cells, single DNA/RNA strands, individual proteins, single molecules, and biopolymers.

NTEGRA Prima Atomic Force Microscope from NT-MDT

NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.

Lambda TriA-SNOM Scanning Near-Field Optical Microscope

APE Research's TriA-SNOM microscope is capable of collecting optical signals in reflection, transmission and back-reflection modes. The instrument is suitable for surface science, optics and biological applications. Tri-SNOM is a microscope that allows the acquisition of three different and simultaneous optical signals, in addition to the topography of the sample.

Apr	JUN	Aug
	14
2010	2011	2012