Condensed Matter > Materials Science
[Submitted on 22 Feb 2010]
Title:Pulsed ESR Measurement of Coherence Times in Si:P at Very Low Temperatures
View PDFAbstract: A purpose built millikelvin pulsed x-band ESR system is used to measure spin decoherence times of phosphorus donor spins in 99.92% isotopically pure 28 silicon. The isolated P spin T2 is estimated at 260 (50) ms at 4.2 K and 330 (100) ms at 0.9 K.
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