(Translated by https://www.hiragana.jp/)
[2303.03712] Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations
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Condensed Matter > Materials Science

arXiv:2303.03712 (cond-mat)
[Submitted on 7 Mar 2023]

Title:Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations

Authors:Nirjhar Sarkar, Prabhakar R. Bandaru, Robert C. Dynes
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Abstract:A methodology to test the interlayer bonding strength of two-dimensional (2D) surfaces and associated one (1D)- and two (2D)- dimensional surface defects using scanning tunneling microscope tip-induced deformation, is demonstrated. Surface elastic deformation characteristics of soft 2D monatomic sheets of graphene and graphite in contrast to NbSe2 indicates related association with the underlying local bonding configurations. Surface deformation of 2D graphitic moire patterns reveal the inter-layer van der Waals strength varying across its domains. These results help in the understanding of the comparable interlayer bonding strength of 1D grain boundary as well as the grains. Anomalous phenomena related to probing 2D materials at small gap distances as a function of strain is discussed.
Comments: Nanotechnology (2023). arXiv admin note: text overlap with arXiv:2111.12901
Subjects: Materials Science (cond-mat.mtrl-sci)
Cite as: arXiv:2303.03712 [cond-mat.mtrl-sci]
  (or arXiv:2303.03712v1 [cond-mat.mtrl-sci] for this version)
  https://doi.org/10.48550/arXiv.2303.03712

Submission history

From: Nirjhar Sarkar [view email]
[v1] Tue, 7 Mar 2023 07:53:54 UTC (906 KB)
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