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Digital Dark Field -- Higher Signal to Noise and Greater Specificity Dark Field Imaging using a 4DSTEM Approach
Authors:
Ian MacLaren,
Andrew T. Fraser,
Matthew R. Lipsett,
Colin Ophus
Abstract:
A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy datasets) as its input. Instead of working on simple summation of intensity, it works on a sparse representation of the diffraction patterns in terms of a list of their diffraction peaks. This is tested on a thin perovskite film containing s…
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A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy datasets) as its input. Instead of working on simple summation of intensity, it works on a sparse representation of the diffraction patterns in terms of a list of their diffraction peaks. This is tested on a thin perovskite film containing structural ordering resulting in additional superlattice spots that reveal details of domain structures, and is shown to give much better selectivity and contrast than conventional virtual dark field imaging. It is also shown to work well in polycrystalline aggregates of CuO nanoparticles. In view of the higher contrast and selectivity, and the complete exclusion of diffuse scattering from the image formation, it is expected to be of significant benefit for characterisation of a wide variety of crystalline materials.
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Submitted 7 May, 2024; v1 submitted 3 May, 2024;
originally announced May 2024.
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Evidence of the Monopolar-Dipolar Crossover Regime: A Multiscale Study of Ferroelastic Domains by In-Situ Microscopy Techniques
Authors:
John J R Scott,
Guangming Lu,
Brian J. Rodriguez,
Ian MacLaren,
Ekhard K. H. Salje,
Miryam Arredondo
Abstract:
The elastic interaction between kinks (and antikinks) within domain walls plays a pivotal role in shaping the domain structure, and their dynamics. In bulk materials, kinks interact as elastic monopoles, dependent on the distance between walls, and typically characterised by a rigid and straight domain configuration. In this work we investigate the evolution of the domain structure as the sample s…
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The elastic interaction between kinks (and antikinks) within domain walls plays a pivotal role in shaping the domain structure, and their dynamics. In bulk materials, kinks interact as elastic monopoles, dependent on the distance between walls, and typically characterised by a rigid and straight domain configuration. In this work we investigate the evolution of the domain structure as the sample size decreases, by means of in-situ heating techniques on free-standing samples. A significant transformation is observed: domain walls exhibit pronounced curvature, accompanied by an increase in both domain wall and junction density. This transformation is attributed to the pronounced influence of kinks, inducing sample warping, where 'dipole dipole' interactions are dominant. Moreover, we experimentally identify a critical thickness range that delineates a cross-over between the monopolar and dipolar regimens and corroborated this by detailed atomic simulations. These findings are relevant for in-situ TEM studies and for the development of novel devices based on free-standing ferroic thin films and nanomaterials.
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Submitted 29 January, 2024;
originally announced January 2024.
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A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software libraries
Authors:
Ian MacLaren,
Enrique Frutos-Myro,
Steven Zeltmann,
Colin Ophus
Abstract:
An approach for the crystallographic mapping of two-phase alloys on the nanoscale using a combination of scanned precession electron diffraction and open-source python libraries is introduced in this paper. This method is demonstrated using the example of a two-phase alpha / beta titanium alloy. The data was recorded using a direct electron detector to collect the patterns, and recently developed…
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An approach for the crystallographic mapping of two-phase alloys on the nanoscale using a combination of scanned precession electron diffraction and open-source python libraries is introduced in this paper. This method is demonstrated using the example of a two-phase alpha / beta titanium alloy. The data was recorded using a direct electron detector to collect the patterns, and recently developed algorithms to perform automated indexing and analyse the crystallography from the results. Very high-quality mapping is achieved at a 3nm step size. The results show the expected Burgers orientation relationships between the alpha laths and beta matrix, as well as the expected misorientations between alpha laths. A minor issue was found that one area was affected by 180° ambiguities in indexing occur due to this area being aligned too close to a zone axis of the alpha with 2-fold projection symmetry (not present in 3D) in the Zero Order Laue Zone, and this should be avoided in data acquisition in the future. Nevertheless, this study demonstrates a good workflow for the analysis of nanocrystalline two- or multi-phase materials, which will be of widespread use in analysing two-phase titanium and other systems and how they evolve as a function of thermomechanical treatments.
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Submitted 2 February, 2024; v1 submitted 17 October, 2023;
originally announced October 2023.
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Simultaneous High-Speed and Low-Dose 4-D STEM Using Compressive Sensing Techniques
Authors:
Alex W. Robinson,
Amirafshar Moshtaghpour,
Jack Wells,
Daniel Nicholls,
Miaofang Chi,
Ian MacLaren,
Angus I. Kirkland,
Nigel D. Browning
Abstract:
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requires only that a random subset of probe locations is acquired from the typical regular scanning grid, which immediately generates both higher speed and…
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Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requires only that a random subset of probe locations is acquired from the typical regular scanning grid, which immediately generates both higher speed and the lower fluence experimentally. We also consider downsampling of the detector, showing that oversampling is inherent within convergent beam electron diffraction (CBED) patterns, and that detector downsampling does not reduce precision but allows faster experimental data acquisition. Analysis of an experimental atomic resolution yttrium silicide data-set shows that it is possible to recover over 25dB peak signal-to-noise in the recovered phase using 0.3% of the total data.
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Submitted 12 December, 2023; v1 submitted 25 September, 2023;
originally announced September 2023.
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Measurement of atomic modulation direction using the azimuthal variation of first order Laue zone electron diffraction
Authors:
Aurys Silinga,
Christopher S. Allen,
Juri Barthel,
Colin Ophus,
Ian MacLaren
Abstract:
We show that diffraction intensity into the First Order Laue Zone (FOLZ) of a crystal can have a strong azimuthal dependence, where this FOLZ ring appears solely because of unidirectional atom position modulation. Such a modulation was already known to cause the appearance of elliptical columns in atom resolution images, but we show that measurement of the angle via 4-dimensional Scanning Transmis…
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We show that diffraction intensity into the First Order Laue Zone (FOLZ) of a crystal can have a strong azimuthal dependence, where this FOLZ ring appears solely because of unidirectional atom position modulation. Such a modulation was already known to cause the appearance of elliptical columns in atom resolution images, but we show that measurement of the angle via 4-dimensional Scanning Transmission Electron Microscopy (4DSTEM) is far more reliable and allows the measurement of the modulation direction with a precision of about 1° and an accuracy of about 3°. This method could be very powerful in characterising atomic structures in 3 dimensions by 4DSTEM, especially in cases where the structure deviates from that found in bulk crystals.
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Submitted 2 October, 2023; v1 submitted 14 September, 2022;
originally announced September 2022.
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Argon bubble formation in tantalum oxide-based films for gravitational wave interferometer mirrors
Authors:
Rebecca B. Cummings,
Riccardo Bassiri,
Iain W. Martin,
Ian MacLaren
Abstract:
The argon content of titanium dioxide doped tantalum pentoxide thin films was quantified in a spatially resolved way using HAADF images and DualEELS. Films annealed at 300$^{\circ}$C, 400$^{\circ}$C and 600$^{\circ}$C were investigated to see if there was a relationship between annealing temperature and bubble formation. It was shown using HAADF imaging that argon is present in most of these films…
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The argon content of titanium dioxide doped tantalum pentoxide thin films was quantified in a spatially resolved way using HAADF images and DualEELS. Films annealed at 300$^{\circ}$C, 400$^{\circ}$C and 600$^{\circ}$C were investigated to see if there was a relationship between annealing temperature and bubble formation. It was shown using HAADF imaging that argon is present in most of these films and that bubbles of argon start to form after annealing at 400$^{\circ}$C and coarsen after annealing at 600$^{\circ}$C. A semi-empirical standard was created for the quantification using argon data from the EELS atlas and experimental data scaled using a Hartree Slater cross section. The density and pressure of argon within the bubbles was calculated for 35 bubbles in the 600$^{\circ}$C sample. The bubbles had a mean diameter, density and pressure of 22Å, 870kg/m$^3$ and 400MPa, respectively. The pressure was calculated using the Van der Waals equation. The bubbles may affect the properties of the films, which are used as optical coatings for mirrors in gravitational wave detectors. This spatially resolved quantification technique can be readily applied to other small noble gas bubbles in a range of materials.
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Submitted 28 October, 2020;
originally announced October 2020.
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Correlative chemical and structural nanocharacterization of a pseudo-binary 0.75Bi(Fe0.97Ti0.03)O3-0.25BaTiO3 ceramic
Authors:
Shane J. McCartan,
Ilkan Calisir,
Gary W. Paterson,
Robert W. H. Webster,
Thomas A. Macgregor,
David A. Hall,
Ian MacLaren
Abstract:
Fast-cooling after sintering or annealing of BiFeO3-BaTiO3 mixed oxide ceramics yields core-shell structures that give excellent functional properties, but their precise phase assemblage and nanostructure remains an open question. By comparing conventional electron energy loss spectroscopy (EELS) with scanning precession electron diffraction (SPED) mapping using a direct electron detector, we corr…
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Fast-cooling after sintering or annealing of BiFeO3-BaTiO3 mixed oxide ceramics yields core-shell structures that give excellent functional properties, but their precise phase assemblage and nanostructure remains an open question. By comparing conventional electron energy loss spectroscopy (EELS) with scanning precession electron diffraction (SPED) mapping using a direct electron detector, we correlate chemical composition with the presence or absence of octahedral tilting and with changes in lattice parameters. This reveals that some grains have a 3-phase assemblage of a BaTiO3-rich pseudocubic shell; a BiFeO3-rich outer core with octahedral tilting consistent with an R3c structure; and an inner core richer in Ba and even poorer in Ti, which seems to show a pseudocubic structure of slightly smaller lattice parameter than the shell region. This last structure has not been previously identified in these materials, but the composition and structure fit with previous studies. These inner cores are likely to be non-polar and play no part in the ferroelectric properties. Nevertheless, the combination of EELS and SPED clearly provides a novel way to examine heterogeneous microstructures with high spatial resolution, thus revealing the presence of phases that may be too subtle to detect with more conventional techniques.
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Submitted 3 November, 2020; v1 submitted 21 October, 2020;
originally announced October 2020.
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Tunable superconductivity in Fe-pnictide heterointerfaces by diffusion control
Authors:
Silvia Haindl,
Sergey Nikolaev,
Michiko Sato,
Masato Sasase,
Ian MacLaren
Abstract:
New Fe-pnictide heterostructures of the type LnOFeAs/BaFe$_2$As$_2$ (Ln = La, Sm) were grown by pulsed laser deposition (PLD) and investigated. Their common structural unit of [Fe$_2$As$_2$] planes allows perfect matching between the different Fe-pnictide unit cells and a coherent and atomically sharp interface. We test the stability of the heterointerface in the presence of Co$^{2+}$ (cations) as…
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New Fe-pnictide heterostructures of the type LnOFeAs/BaFe$_2$As$_2$ (Ln = La, Sm) were grown by pulsed laser deposition (PLD) and investigated. Their common structural unit of [Fe$_2$As$_2$] planes allows perfect matching between the different Fe-pnictide unit cells and a coherent and atomically sharp interface. We test the stability of the heterointerface in the presence of Co$^{2+}$ (cations) as well as for excess O$^{2-}$ (anions) and discuss the consequences on the electronic properties: While undoped SmOFeAs/BaFe$_2$As$_2$ remains non-superconducting, a balanced Co-concentration after diffusion across the interface results in superconductivity within Co-substituted variants. In contrast, excess O$^{2-}$ causes the formation of an interfacial layer in SmOFeAs/BaFe$_2$As$_2$ with increased O$^{2-}$/As$^{3-}$ ratio and develops a metal-to-superconductor transition with time. The engineered heterointerfaces may provide a sophisticated pathway to bridge the gap between Fe-pnictides and Fe-chalcogenides.
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Submitted 10 September, 2020;
originally announced September 2020.
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post Acquisition Data Processing, Visualisation, and Structural Characterisation
Authors:
Gary W. Paterson,
Robert W. H. Webster,
Andrew Ross,
Kirsty A. Paton,
Thomas A. Macgregor,
Damien McGrouther,
Ian MacLaren,
Magnus Nord
Abstract:
Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of operation. However, several issues remain around the post acquisition processing and visualisation of the often very large multidimensional STEM datasets produced by…
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Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of operation. However, several issues remain around the post acquisition processing and visualisation of the often very large multidimensional STEM datasets produced by them. We discuss these issues and present open source software libraries to enable efficient processing and visualisation of such datasets. Throughout, we provide examples of the analysis methodologies presented, utilising data from a 256$\times$256 pixel Medipix3 hybrid DED detector, with a particular focus on the STEM characterisation of the structural properties of materials. These include the techniques of virtual detector imaging; higher order Laue zone analysis; nanobeam electron diffraction; and scanning precession electron diffraction. In the latter, we demonstrate nanoscale lattice parameter mapping with a fractional precision $\le 6\times10^{-4}$ (0.06%).
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Submitted 22 June, 2020; v1 submitted 6 April, 2020;
originally announced April 2020.
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing and Storage
Authors:
Magnus Nord,
Robert W. H. Webster,
Kirsty A. Paton,
Stephen McVitie,
Damien McGrouther,
Ian MacLaren,
Gary W. Paterson
Abstract:
The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical challenges associated with them. These include issues related to hardware control, and the acquisition, real-time processing and visualisation, and storage of d…
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The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical challenges associated with them. These include issues related to hardware control, and the acquisition, real-time processing and visualisation, and storage of data from such detectors. We discuss these problems and present software solutions for them, with a view to making the benefits of new detectors in the context of STEM more accessible. Throughout, we provide examples of the application of the technologies presented, using data from a Medipix3 direct electron detector. Most of our software is available under an open source licence, permitting transparency of the implemented algorithms, and allowing the community to freely use and further improve upon them.
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Submitted 9 June, 2020; v1 submitted 18 November, 2019;
originally announced November 2019.
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Strain analysis of Ge micro disk using precession electron diffraction
Authors:
Aneeqa Bashir,
Ross. W. Millar,
Kevin Gallacher,
Douglas. J. Paul,
Amith. D. Darbal,
Robert Stroud,
Andrea Ballabio,
Jacopo Frigerio,
Giovanni Isella,
Ian MacLaren
Abstract:
The recently developed precession electron diffraction (PED) technique in scanning transmission electron microscopy (STEM) has been used to elucidate the local strain distribution and crystalline misorientation in CMOS fabricated strained Ge micro disk structure grown on Si substrate. Such structures are considered to be a compact optical source for the future photonics due to the specific undercu…
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The recently developed precession electron diffraction (PED) technique in scanning transmission electron microscopy (STEM) has been used to elucidate the local strain distribution and crystalline misorientation in CMOS fabricated strained Ge micro disk structure grown on Si substrate. Such structures are considered to be a compact optical source for the future photonics due to the specific undercut for direct bandgap behaviour under strain. In this study, the strain maps are interpreted and compared with a finite element model (FEM) of the strain in the investigated structure. Results demonstrate that the SiN used as a stressor on top of the Ge disk induces an in-plane strain $ε_{xx}$ of a maximum value of almost 2 % which is also confirmed by FEM simulations. This tensile strain can reduce the difference between the direct and indirect bandgaps leading to direct bandgap radiative transitions, with the potential for applications in strained Ge lasers.
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Submitted 6 June, 2019;
originally announced June 2019.
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3D sub-nanoscale imaging of unit cell doubling due to octahedral tilting and cation modulation in strained perovskite thin films
Authors:
Magnus Nord,
Andrew Ross,
Damien McGrouther,
Juri Barthel,
Magnus Moreau,
Ingrid Hallsteinsen,
Thomas Tybell,
Ian MacLaren
Abstract:
Determining the 3-dimensional crystallography of a material with sub-nanometre resolution is essential to understanding strain effects in epitaxial thin films. A new scanning transmission electron microscopy imaging technique is demonstrated that visualises the presence and strength of atomic movements leading to a period doubling of the unit cell along the beam direction, using the intensity in a…
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Determining the 3-dimensional crystallography of a material with sub-nanometre resolution is essential to understanding strain effects in epitaxial thin films. A new scanning transmission electron microscopy imaging technique is demonstrated that visualises the presence and strength of atomic movements leading to a period doubling of the unit cell along the beam direction, using the intensity in an extra Laue zone ring in the back focal plane recorded using a pixelated detector method. This method is used together with conventional atomic resolution imaging in the plane perpendicular to the beam direction to gain information about the 3D crystal structure in an epitaxial thin film of LaFeO3 sandwiched between a substrate of (111) SrTiO3 and a top layer of La0.7Sr0.3MnO3. It is found that a hitherto unreported structure of LaFeO3 is formed under the unusual combination of compressive strain and (111) growth, which is triclinic with a periodicity doubling from primitive perovskite along one of the three <110> directions lying in the growth plane. This results from a combination of La-site modulation along the beam direction, and modulation of oxygen positions resulting from octahedral tilting. This transition to the period-doubled cell is suppressed near both the substrate and near the La0.7Sr0.3MnO3 top layer due to the clamping of the octahedral tilting by the absence of tilting in the substrate and due to an incompatible tilt pattern being present in the La0.7Sr0.3MnO3 layer. This work shows a rapid and easy way of scanning for such transitions in thin films or other systems where disorder-order transitions or domain structures may be present and does not require the use of atomic resolution imaging, and could be done on any scanning TEM instrument equipped with a suitable camera.
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Submitted 24 October, 2018; v1 submitted 17 October, 2018;
originally announced October 2018.
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Medipix3 Demonstration and understanding of near ideal detector performance for 60 & 80 keV electrons
Authors:
J. A. Mir,
R. Clough,
R. MacInnes,
C. Gough,
R. Plackett,
I. Shipsey,
H. Sawada,
I. MacLaren,
R. Ballabriga,
D. Maneuski,
V. O'Shea,
D. McGrouther,
A. I. Kirkland
Abstract:
In our article we report first quantitative measurements of imaging performance for the current generation of hybrid pixel detector, Medipix3, as direct electron detector. Utilising beam energies of 60 & 80 keV, measurements of modulation transfer function (MTF) and detective quantum efficiency (DQE) have revealed that, in single pixel mode (SPM), energy threshold values can be chosen to maximize…
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In our article we report first quantitative measurements of imaging performance for the current generation of hybrid pixel detector, Medipix3, as direct electron detector. Utilising beam energies of 60 & 80 keV, measurements of modulation transfer function (MTF) and detective quantum efficiency (DQE) have revealed that, in single pixel mode (SPM), energy threshold values can be chosen to maximize either the MTF or DQE, obtaining values near to, or even exceeding, those for an ideal detector. We have demonstrated that the Medipix3 charge summing mode (CSM) can deliver simultaneous, near ideal values of both MTF and DQE. To understand direct detection performance further we have characterized the detector response to single electron events, building an empirical model which can predict detector MTF and DQE performance based on energy threshold. Exemplifying our findings we demonstrate the Medipix3 imaging performance, recording a fully exposed electron diffraction pattern at 24-bit depth and images in SPM and CSM modes. Taken together our findings highlight that for transmission electron microscopy performed at low energies (energies <100 keV) thick hybrid pixel detectors provide an advantageous and alternative architecture for direct electron imaging
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Submitted 26 August, 2016;
originally announced August 2016.
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Medium range structural order in amorphous tantala spatially resolved with changes to atomic structure by thermal annealing
Authors:
Martin J. Hart,
Riccardo Bassiri,
Konstantin B. Borisenko,
Muriel Véron,
Edgar F. Rauch,
Iain W. Martin,
Sheila Rowan,
Martin M. Fejer,
Ian MacLaren
Abstract:
Amorphous tantala (a-Ta2O5) is an important technological material that has wide ranging applications in electronics, optics and the biomedical industry. It is used as the high refractive index layers in the multi-layer dielectric mirror coatings in the latest generation of gravitational wave interferometers, as well as other precision interferometers. One of the current limitations in sensitivity…
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Amorphous tantala (a-Ta2O5) is an important technological material that has wide ranging applications in electronics, optics and the biomedical industry. It is used as the high refractive index layers in the multi-layer dielectric mirror coatings in the latest generation of gravitational wave interferometers, as well as other precision interferometers. One of the current limitations in sensitivity of gravitational wave detectors is Brownian thermal noise that arises from the tantala mirror coatings. Measurements have shown differences in mechanical loss of the mirror coatings, which is directly related to Brownian thermal noise, in response to thermal annealing. We utilise scanning electron diffraction to perform Fluctuation Electron Microscopy (FEM) on Ion Beam Sputtered (IBS) amorphous tantala coatings, definitively showing an increase in the medium range order (MRO), as determined from the variance between the diffraction patterns in the scan, due to thermal annealing at increasing temperatures. Moreover, we employ Virtual Dark-Field Imaging (VDFi) to spatially resolve the FEM signal, enabling investigation of the persistence of the fragments responsible for the medium range order, as well as the extent of the ordering over nm length scales, and show ordered patches larger than 5 nm in the highest temperature annealed sample. These structural changes directly correlate with the observed changes in mechanical loss.
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Submitted 29 March, 2016; v1 submitted 4 August, 2015;
originally announced August 2015.
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Effect of heat treatment on mechanical dissipation in Ta$_2$O$_5$ coatings
Authors:
I W Martin,
R Bassiri,
R Nawrodt,
M M Fejer,
A Gretarsson,
E Gustafson,
G Harry,
J Hough,
I MacLaren,
S Penn,
S Reid,
R Route,
S Rowan,
C Schwar,
P Seidel,
J Scott,
A L Woodcraft
Abstract:
Thermal noise arising from mechanical dissipation in dielectric reflective coatings is expected to critically limit the sensitivity of precision measurement systems such as high-resolution optical spectroscopy, optical frequency standards and future generations of interferometric gravitational wave detectors. We present measurements of the effect of post-deposition heat treatment on the temperatur…
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Thermal noise arising from mechanical dissipation in dielectric reflective coatings is expected to critically limit the sensitivity of precision measurement systems such as high-resolution optical spectroscopy, optical frequency standards and future generations of interferometric gravitational wave detectors. We present measurements of the effect of post-deposition heat treatment on the temperature dependence of the mechanical dissipation in ion-beam sputtered tantalum pentoxide between 11\,K and 300\,K. We find the temperature dependence of the dissipation is strongly dependent on the temperature at which the heat treatment was carried out, and we have identified three dissipation peaks occurring at different heat treatment temperatures. At temperatures below 200\,K, the magnitude of the loss was found to increase with higher heat treatment temperatures, indicating that heat treatment is a significant factor in determining the level of coating thermal noise.
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Submitted 4 October, 2010;
originally announced October 2010.
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Measurements of a low temperature mechanical dissipation peak in a single layer of Ta2O5 doped with TiO2
Authors:
I Martin,
H Armandula,
C Comtet,
M M Fejer,
A Gretarsson,
G Harry,
J Hough,
J-M M Mackowski,
I MacLaren,
C Michel,
J-L Montorio,
N Morgado,
R Nawrodt,
S Penn,
S Reid,
A Remillieux,
R Route,
S Rowan,
C Schwarz,
P Seidel,
W Vodel,
A. Zimmer
Abstract:
Thermal noise arising from mechanical dissipation in oxide coatings is a major limitation to many precision measurement systems, including optical frequency standards, high resolution optical spectroscopy and interferometric gravity wave detectors. Presented here are measurements of dissipation as a function of temperature between 7 K and 290 K in ion-beam sputtered Ta2O5 doped with TiO2, showin…
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Thermal noise arising from mechanical dissipation in oxide coatings is a major limitation to many precision measurement systems, including optical frequency standards, high resolution optical spectroscopy and interferometric gravity wave detectors. Presented here are measurements of dissipation as a function of temperature between 7 K and 290 K in ion-beam sputtered Ta2O5 doped with TiO2, showing a loss peak at 20 K. Analysis of the peak provides the first evidence of the source of dissipation in doped Ta2O5 coatings, leading to possibilities for the reduction of thermal noise effects.
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Submitted 19 February, 2008;
originally announced February 2008.
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Titania-doped tantala/silica coatings for gravitational-wave detection
Authors:
Gregory M. Harry,
Matthew R. Abernathy,
Andres E. Becerra-Toledo,
Helena Armandula,
Eric Black,
Kate Dooley,
Matt Eichenfield,
Chinyere Nwabugwu,
Akira Villar,
D. R. M. Crooks,
Gianpietro Cagnoli,
Jim Hough,
Colin R. How,
Ian MacLaren,
Peter Murray,
Stuart Reid,
Sheila Rowan,
Peter H. Sneddon,
Martin M Fejer,
Roger Route,
Steven D. Penn,
Patrick Ganau,
Jean-Marie Mackowski,
Christophe Michel,
Laurent Pinard
, et al. (1 additional authors not shown)
Abstract:
Reducing thermal noise from optical coatings is crucial to reaching the required sensitivity in next generation interferometric gravitational-waves detectors. Here we show that adding TiO$_2$ to Ta$_2$O$_5$ in Ta$_2$O$_5$/SiO$_2$ coatings reduces the internal friction and in addition present data confirming it reduces thermal noise. We also show that TiO$_2$-doped Ta$_2$O$_5$/SiO$_2$ coatings ar…
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Reducing thermal noise from optical coatings is crucial to reaching the required sensitivity in next generation interferometric gravitational-waves detectors. Here we show that adding TiO$_2$ to Ta$_2$O$_5$ in Ta$_2$O$_5$/SiO$_2$ coatings reduces the internal friction and in addition present data confirming it reduces thermal noise. We also show that TiO$_2$-doped Ta$_2$O$_5$/SiO$_2$ coatings are close to satisfying the optical absorption requirements of second generation gravitational-wave detectors.
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Submitted 1 October, 2006;
originally announced October 2006.
