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A Ti/Pt/Co multilayer stack for transfer function based magnetic force microscopy calibrations
Authors:
Baha Sakar,
Sibylle Sievers,
Alexander Fernandez Scarioni,
Felipe Garcia-Sanchez,
Ilker Oztoprak,
Hans Werner Schumacher,
Osman Ozturk
Abstract:
Magnetic force microscopy is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond qu…
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Magnetic force microscopy is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample's magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed
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Submitted 24 January, 2022;
originally announced January 2022.
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Structural and Morphological Effect of Ti underlayer on Pt/Co/Pt Magnetic Ultra-Thin Film
Authors:
Melek Türksoy Öcal,
Baha Sakar,
İlker Öztoprak,
Zoltan Balogh-Michels,
Antonia Neels,
Osman Öztürk
Abstract:
Pt(xÅ)/Co(5Å)/Pt(10Å) trilayer films were deposited on naturally oxidized Si(111) substrate to investigate Ti underlayer effect on PMA. A small amount of Ti underlayer promoted the magnetic anisotropy to a perpendicular direction for x=8Å and 10Å. Both GI XRD and STM results showed that the Ti underlayer manipulated the growth of trilayer film. The Pt particles preferably grow the neighborhood of…
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Pt(xÅ)/Co(5Å)/Pt(10Å) trilayer films were deposited on naturally oxidized Si(111) substrate to investigate Ti underlayer effect on PMA. A small amount of Ti underlayer promoted the magnetic anisotropy to a perpendicular direction for x=8Å and 10Å. Both GI XRD and STM results showed that the Ti underlayer manipulated the growth of trilayer film. The Pt particles preferably grow the neighborhood of the Ti cluster, giving rise to a relatively smooth layer with a fiber texture fcc (111) structure. By contrast, the absence of Ti underlayer leads to clustered, relatively rough, and randomly oriented nano-crystalline growth. Differences in the growth mode, especially roughness, also appeared as intensity loss in XPS spectra due to shadowing effects. Our results indicate that a traceable amount of underlayer can change the magnetic anisotropy of the film by manipulating film growth.
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Submitted 19 May, 2021;
originally announced May 2021.
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Quantum calibrated magnetic force microscopy
Authors:
Baha Sakar,
Yan Liu,
Sibylle Sievers,
Volker Neu,
Johannes Lang,
Christian Osterkamp,
Matthew L. Markham,
Osman Öztürk,
Fedor Jelezko,
Hans W. Schumacher
Abstract:
We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray field m…
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We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray field maps. This novel approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray field measurements in a field range inaccessible to scanning NV magnetometry. Quantum calibrated measurements of a stray field reference sample allow its use as a transfer standard, opening the road towards fast and easily accessible quantum traceable calibrations of virtually any MFM.
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Submitted 6 December, 2021; v1 submitted 25 March, 2021;
originally announced March 2021.
