Direct Observation of Sub-Poissonian Temporal Statistics in a Continuous Free Electron Beam with Sub-picosecond Resolution
Authors:
S. Borrelli,
T. C. H. de Raadt,
P. H. A. Mutsaers,
K. A. H. van Leeuwen,
O. J. Luiten
Abstract:
We present a novel method to measure the arrival time statistics of continuous electron beams with sub-ps resolution, based on the combination of an RF deflection cavity and fast single electron imaging. We observe Poissonian statistics within time bins from 100~ns to 2~ns and increasingly pronounced sub-Poissonian statistics as the time bin decreases from 2~ps to 340~fs. This 2D streak-camera in…
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We present a novel method to measure the arrival time statistics of continuous electron beams with sub-ps resolution, based on the combination of an RF deflection cavity and fast single electron imaging. We observe Poissonian statistics within time bins from 100~ns to 2~ns and increasingly pronounced sub-Poissonian statistics as the time bin decreases from 2~ps to 340~fs. This 2D streak-camera in principle enables femtosecond-level arrival time measurements, paving the way to observing Pauli blocking effects in electron beams and thus serving as an essential diagnostic tool towards degenerate electron beam sources for free electron quantum optics.
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Submitted 26 January, 2024; v1 submitted 13 October, 2023;
originally announced October 2023.
Generation and Measurement of Sub-Micrometer Relativistic Electron Beams
Authors:
Simona Borrelli,
Gian Luca Orlandi,
Martin Bednarzik,
Christian David,
Eugenio Ferrari,
Vitaliy A. Guzenko,
Cigdem Ozkan-Loch,
Eduard Prat,
Rasmus Ischebeck
Abstract:
The generation of low-emittance electron beams has received significant interest in recent years. Driven by the requirements of X-ray free electron lasers, the emittance of photocathode injectors has been reduced significantly, with a corresponding increase in beam brightness. At the same time, this has put increasingly stringent requirements on the instrumentation to measure the beam size. These…
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The generation of low-emittance electron beams has received significant interest in recent years. Driven by the requirements of X-ray free electron lasers, the emittance of photocathode injectors has been reduced significantly, with a corresponding increase in beam brightness. At the same time, this has put increasingly stringent requirements on the instrumentation to measure the beam size. These requirements are even more stringent for novel accelerator developments, such as laser-driven accelerators based on dielectric structures or on a plasma, or for linear colliders at the energy frontier. We present here the generation and measurement of a sub-micrometer electron beam, at a particle energy of 330 MeV, and a bunch charge below 1 pC. An electron beam optics with a beta-function of a few millimeters in the vertical plane had been set up. The beam was characterized through a wire scanner that employs a 1 um wide metallic structure fabricated using the electron beam lithography on a silicon nitride membrane. The smallest (rms) beam size presented here is less than 500 nm.
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Submitted 11 April, 2018;
originally announced April 2018.
