-
Streaming Large-Scale Electron Microscopy Data to a Supercomputing Facility
Authors:
Samuel S. Welborn,
Chris Harris,
Stephanie M. Ribet,
Georgios Varnavides,
Colin Ophus,
Bjoern Enders,
Peter Ercius
Abstract:
Data management is a critical component of modern experimental workflows. As data generation rates increase, transferring data from acquisition servers to processing servers via conventional file-based methods is becoming increasingly impractical. The 4D Camera at the National Center for Electron Microscopy (NCEM) generates data at a nominal rate of 480 Gbit/s (87,000 frames/s) producing a 700 GB…
▽ More
Data management is a critical component of modern experimental workflows. As data generation rates increase, transferring data from acquisition servers to processing servers via conventional file-based methods is becoming increasingly impractical. The 4D Camera at the National Center for Electron Microscopy (NCEM) generates data at a nominal rate of 480 Gbit/s (87,000 frames/s) producing a 700 GB dataset in fifteen seconds. To address the challenges associated with storing and processing such quantities of data, we developed a streaming workflow that utilizes a high-speed network to connect the 4D Camera's data acquisition (DAQ) system to supercomputing nodes at the National Energy Research Scientific Computing Center (NERSC), bypassing intermediate file storage entirely. In this work, we demonstrate the effectiveness of our streaming pipeline in a production setting through an hour-long experiment that generated over 10 TB of raw data, yielding high-quality datasets suitable for advanced analyses. Additionally, we compare the efficacy of this streaming workflow against the conventional file-transfer workflow by conducting a post-mortem analysis on historical data from experiments performed by real users. Our findings show that the streaming workflow significantly improves data turnaround time, enables real-time decision-making, and minimizes the potential for human error by eliminating manual user interactions.
△ Less
Submitted 3 July, 2024;
originally announced July 2024.
-
Intrinsic Optical Bistability of Photon Avalanching Nanocrystals
Authors:
Artiom Skripka,
Zhuolei Zhang,
Xiao Qi,
Benedikt Ursprung,
Peter Ercius,
Bruce E. Cohen,
P. James Schuck,
Daniel Jaque,
Emory M. Chan
Abstract:
Optically bistable materials respond to a single input with two possible optical outputs, contingent upon excitation history. Such materials would be ideal for optical switching and memory, yet limited understanding of intrinsic optical bistability (IOB) prevents development of nanoscale IOB materials suitable for devices. Here, we demonstrate IOB in Nd3+-doped KPb2Cl5 avalanching nanoparticles (A…
▽ More
Optically bistable materials respond to a single input with two possible optical outputs, contingent upon excitation history. Such materials would be ideal for optical switching and memory, yet limited understanding of intrinsic optical bistability (IOB) prevents development of nanoscale IOB materials suitable for devices. Here, we demonstrate IOB in Nd3+-doped KPb2Cl5 avalanching nanoparticles (ANPs), which switch with high contrast between luminescent and non-luminescent states, with hysteresis characteristic of bistability. We elucidate a nonthermal mechanism in which IOB originates from suppressed nonradiative relaxation in Nd3+ ions and from the positive feedback of photon avalanching, resulting in extreme, >200th-order optical nonlinearities. Modulation of laser pulsing tunes hysteresis widths, and dual-laser excitation enables transistor-like optical switching. This control over nanoscale IOB establishes ANPs for photonic devices in which light is used to manipulate light.
△ Less
Submitted 6 March, 2024;
originally announced March 2024.
-
Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography
Authors:
Stephanie M. Ribet,
Georgios Varnavides,
Cassio C. S. Pedroso,
Bruce E. Cohen,
Peter Ercius,
Mary C. Scott,
Colin Ophus
Abstract:
In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but contrast, dose, and projection limitations make conventional imaging modes insufficient for fully characterizing these structures. Phase retrieval methods provi…
▽ More
In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but contrast, dose, and projection limitations make conventional imaging modes insufficient for fully characterizing these structures. Phase retrieval methods provide a promising alternative imaging mode, and in particular, multislice electron ptychography can recover depth-dependent information. Here, we study beam-sensitive photon upconverting core-shell nanoparticles with a multislice ptychography approach using a low electron dose to avoid damage. Large strain fields arise in these heterostructures due to the mismatch in lattice parameter between the core and the shell. We reconstruct both a nanoparticle that appears defect-free and one that has a large break in the side and map the distribution of strain in 3D by computing distortion fields from high-resolution potential images of each slice. In the defect-free nanoparticle, we observe twisting of the shell, while in the broken nanoparticle we measure the 3D position of the crack, the core, and dislocations. These results highlight the advantage of multislice electron ptychography to recover 3D information from a single scan, even under strict electron dose requirements from beam-sensitive samples.
△ Less
Submitted 15 February, 2024;
originally announced February 2024.
-
The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Authors:
Peter Ercius,
Ian J. Johnson,
Philipp Pelz,
Benjamin H. Savitzky,
Lauren Hughes,
Hamish G. Brown,
Steven E. Zeltmann,
Shang-Lin Hsu,
Cassio C. S. Pedroso,
Bruce E. Cohen,
Ramamoorthy Ramesh,
David Paul,
John M. Joseph,
Thorsten Stezelberger,
Cory Czarnik,
Matthew Lent,
Erin Fong,
Jim Ciston,
Mary C. Scott,
Colin Ophus,
Andrew M. Minor,
and Peter Denes
Abstract:
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700…
▽ More
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 - 300 keV. Through electron counting, the resulting sparse data sets are reduced in size by 10 - 300x compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex 4D-STEM experiments to be accomplished with typical STEM scanning parameters.
△ Less
Submitted 19 May, 2023;
originally announced May 2023.
-
Imaging 3D Chemistry at 1 nm Resolution with Fused Multi-Modal Electron Tomography
Authors:
Jonathan Schwartz,
Zichao Wendy Di,
Yi Jiang,
Jason Manassa,
Jacob Pietryga,
Yiwen Qian,
Min Gee Cho,
Jonathan L. Rowell,
Huihuo Zheng,
Richard D. Robinson,
Junsi Gu,
Alexey Kirilin,
Steve Rozeveld,
Peter Ercius,
Jeffrey A. Fessler,
Ting Xu,
Mary Scott,
Robert Hovden
Abstract:
Measuring the three-dimensional (3D) distribution of chemistry in nanoscale matter is a longstanding challenge for metrological science. The inelastic scattering events required for 3D chemical imaging are too rare, requiring high beam exposure that destroys the specimen before an experiment completes. Even larger doses are required to achieve high resolution. Thus, chemical mapping in 3D has been…
▽ More
Measuring the three-dimensional (3D) distribution of chemistry in nanoscale matter is a longstanding challenge for metrological science. The inelastic scattering events required for 3D chemical imaging are too rare, requiring high beam exposure that destroys the specimen before an experiment completes. Even larger doses are required to achieve high resolution. Thus, chemical mapping in 3D has been unachievable except at lower resolution with the most radiation-hard materials. Here, high-resolution 3D chemical imaging is achieved near or below one nanometer resolution in a Au-Fe$_3$O$_4$ metamaterial, Co$_3$O$_4$ - Mn$_3$O$_4$ core-shell nanocrystals, and ZnS-Cu$_{0.64}$S$_{0.36}$ nanomaterial using fused multi-modal electron tomography. Multi-modal data fusion enables high-resolution chemical tomography often with 99\% less dose by linking information encoded within both elastic (HAADF) and inelastic (EDX / EELS) signals. Now sub-nanometer 3D resolution of chemistry is measurable for a broad class of geometrically and compositionally complex materials.
△ Less
Submitted 18 June, 2024; v1 submitted 24 April, 2023;
originally announced April 2023.
-
Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy
Authors:
Alexander Pattison,
Cassio C. S. Pedroso,
Bruce E. Cohen,
Justin C. Ondry,
A. Paul Alivisatos,
Wolfgang Theis,
Peter Ercius
Abstract:
Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. H…
▽ More
Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using a custom built sample stage and automation program. The program is capable of operating over many hours without human intervention improving the statistics of high-resolution experiments.
△ Less
Submitted 31 July, 2023; v1 submitted 9 March, 2023;
originally announced March 2023.
-
Imaging the electron charge density in monolayer MoS2 at the Ångstrom scale
Authors:
Joel Martis,
Sandhya Susarla,
Archith Rayabharam,
Cong Su,
Timothy Paule,
Philipp Pelz,
Cassandra Huff,
Xintong Xu,
Hao-Kun Li,
Marc Jaikissoon,
Victoria Chen,
Eric Pop,
Krishna Saraswat,
Alex Zettl,
Narayana R. Aluru,
Ramamoorthy Ramesh,
Peter Ercius,
Arun Majumdar
Abstract:
Four-dimensional scanning transmission electron microscopy (4D-STEM) has recently gained widespread attention for its ability to image atomic electric fields with sub-Ångstrom spatial resolution. These electric field maps represent the integrated effect of the nucleus, core electrons and valence electrons, and separating their contributions is non-trivial. In this paper, we utilized simultaneously…
▽ More
Four-dimensional scanning transmission electron microscopy (4D-STEM) has recently gained widespread attention for its ability to image atomic electric fields with sub-Ångstrom spatial resolution. These electric field maps represent the integrated effect of the nucleus, core electrons and valence electrons, and separating their contributions is non-trivial. In this paper, we utilized simultaneously acquired 4D-STEM center of mass (CoM) images and annular dark field (ADF) images to determine the electron charge density in monolayer MoS2. We find that both the core electrons and the valence electrons contribute to the derived electron charge density. However, due to blurring by the probe shape, the valence electron contribution forms a nearly featureless background while most of the spatial modulation comes from the core electrons. Our findings highlight the importance of probe shape in interpreting charge densities derived from 4D STEM.
△ Less
Submitted 31 July, 2023; v1 submitted 17 October, 2022;
originally announced October 2022.
-
Indefinite and Bidirectional Near Infrared Nanocrystal Photoswitching
Authors:
Changhwan Lee,
Emma Z. Xu,
Kevin W. C. Kwock,
Ayelet Teitelboim,
Yawei Liu,
Natalie Fardian-Melamed,
Cassio C. S. Pedroso,
Hye Sun Park,
Jongwoo Kim,
Stefanie D. Pritzl,
Sang Hwan Nam,
Theobald Lohmueller,
Peter Ercius,
Yung Doug Suh,
Bruce E Cohen,
Emory M Chan,
P. James Schuck
Abstract:
Materials whose luminescence can be switched by optical stimulation drive technologies ranging from superresolution imaging1-4, nanophotonics5, and optical data storage6-8, to targeted pharmacology, optogenetics, and chemical reactivity9. These photoswitchable probes, including organic fluorophores and proteins, are prone to photodegradation, and often require phototoxic doses of ultraviolet (UV)…
▽ More
Materials whose luminescence can be switched by optical stimulation drive technologies ranging from superresolution imaging1-4, nanophotonics5, and optical data storage6-8, to targeted pharmacology, optogenetics, and chemical reactivity9. These photoswitchable probes, including organic fluorophores and proteins, are prone to photodegradation, and often require phototoxic doses of ultraviolet (UV) or visible light. Colloidal inorganic nanoparticles have significant stability advantages over existing photoswitchable materials, but the ability to switch emission bidirectionally, particularly with NIR light, has not been reported with nanoparticles. Here, we present 2-way, near-infrared (NIR) photoswitching of avalanching nanoparticles (ANPs), showing full optical control of upconverted emission using phototriggers in the NIR-I and NIR-II spectral regions useful for subsurface imaging. Employing single-step photodarkening10-13 and photobrightening12,14-18, we demonstrate indefinite photoswitching of individual nanoparticles (>1000 cycles over 7 h) in ambient or aqueous conditions without measurable photodegradation. Critical steps of the photoswitching mechanism are elucidated by modeling and by measuring the photon avalanche properties of single ANPs in both bright and dark states. Unlimited, reversible photoswitching of ANPs enables indefinitely rewritable 2D and 3D multi-level optical patterning of ANPs, as well as optical nanoscopy with sub-Å localization superresolution that allows us to distinguish individual ANPs within tightly packed clusters.
△ Less
Submitted 13 September, 2022;
originally announced September 2022.
-
Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography
Authors:
Philipp M Pelz,
Sinead Griffin,
Scott Stonemeyer,
Derek Popple,
Hannah Devyldere,
Peter Ercius,
Alex Zettl,
Mary C Scott,
Colin Ophus
Abstract:
Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined using phase-contrast single-particle cryo-electron microscopy from thousands of identical proteins, and reconstructions have rea…
▽ More
Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined using phase-contrast single-particle cryo-electron microscopy from thousands of identical proteins, and reconstructions have reached atomic resolution for specific proteins. In materials science, three-dimensional atomic structures of complex nanomaterials have been determined using a combination of annular dark field (ADF) scanning transmission electron microscopic (STEM) tomography and subpixel localization of atomic peaks, in a method termed atomic electron tomography (AET). However, neither of these methods can determine the three-dimensional atomic structure of heterogeneous nanomaterials containing light elements. Here, we perform mixed-state electron ptychography from 34.5 million diffraction patterns to reconstruct a high-resolution tilt series of a double wall-carbon nanotube (DW-CNT), encapsulating a complex $\mathrm{ZrTe}$ sandwich structure. Class averaging of the resulting reconstructions and subpixel localization of the atomic peaks in the reconstructed volume reveals the complex three-dimensional atomic structure of the core-shell heterostructure with 17 picometer precision. From these measurements, we solve the full $\mathrm{Zr_{11}Te_{50}}$ structure, which contains a previously unobserved $\mathrm{ZrTe_{2}}$ phase in the core. The experimental realization of ptychographic atomic electron tomography (PAET) will allow for structural determination of a wide range of nanomaterials which are beam-sensitive or contain light elements.
△ Less
Submitted 17 June, 2022;
originally announced June 2022.
-
Symmetry-Breaking and Self-Sorting in Block Copolymer-based Multicomponent Nanocomposites
Authors:
Le Ma,
Hejin Huang,
Peter Ercius,
Alfredo Alexander-Katz,
Ting Xu
Abstract:
Co-assembly of inorganic nanoparticles (NPs) and nanostructured polymer matrix represents an intricate interplay of enthalpic or entropic forces. Particle size largely affects the phase behavior of the nanocomposite. Theoretical studies indicate that new morphologies would emerge when the particles become comparable to the soft matrix's size, but this has rarely been supported experimentally. By d…
▽ More
Co-assembly of inorganic nanoparticles (NPs) and nanostructured polymer matrix represents an intricate interplay of enthalpic or entropic forces. Particle size largely affects the phase behavior of the nanocomposite. Theoretical studies indicate that new morphologies would emerge when the particles become comparable to the soft matrix's size, but this has rarely been supported experimentally. By designing a multicomponent blend composed of NPs, block copolymer-based supramolecules, and small molecules, a 3-D ordered lattice beyond the native BCP's morphology was recently reported when the particle is larger than the microdomain of BCP. The blend can accommodate various formulation variables. In this contribution, when the particle size equals the microdomain size, a symmetry-broken phase appears in a narrow range of particle sizes and compositions, which we named the "train track" structure. In this phase, the NPs aligned into a 3-D hexagonal lattice and packed asymmetrically along the c axis, making the projection of the ac and the bc plane resemble train tracks. Computation studies show that the broken symmetry reduces the polymer chain deformation and stabilizes the metastable hexagonally perforated lamellar morphology. Given the mobility of the multicomponent blend, the system shows a self-sorting behavior: segregating into two macroscopic phases with different nanostructures based on only a few nanometers NP size differences. Smaller NPs form "train track" morphology, while larger NPs form "simple hexagon" structure, where the NPs take a symmetric hexagonal arrangement. Detailed structural evolution and simulation studies confirm the systematic-wide cooperativity across different components, indicating the strong self-regulation of the multicomponent system.
△ Less
Submitted 21 April, 2022;
originally announced April 2022.
-
Atomic-scale identification of the active sites of nanocatalysts
Authors:
Yao Yang,
Jihan Zhou,
Zipeng Zhao,
Geng Sun,
Saman Moniri,
Colin Ophus,
Yongsoo Yang,
Ziyang Wei,
Yakun Yuan,
Cheng Zhu,
Qiang Sun,
Qingying Jia,
Hendrik Heinz,
Jim Ciston,
Peter Ercius,
Philippe Sautet,
Yu Huang,
Jianwei Miao
Abstract:
Alloy nanocatalysts have found broad applications ranging from fuel cells to catalytic converters and hydrogenation reactions. Despite extensive studies, identifying the active sites of nanocatalysts remains a major challenge due to the heterogeneity of the local atomic environment. Here, we advance atomic electron tomography to determine the 3D local atomic structure, surface morphology and chemi…
▽ More
Alloy nanocatalysts have found broad applications ranging from fuel cells to catalytic converters and hydrogenation reactions. Despite extensive studies, identifying the active sites of nanocatalysts remains a major challenge due to the heterogeneity of the local atomic environment. Here, we advance atomic electron tomography to determine the 3D local atomic structure, surface morphology and chemical composition of PtNi and Mo-doped PtNi nanocatalysts. Using machine learning trained by density functional theory calculations, we identify the catalytic active sites for the oxygen reduction reaction from experimental 3D atomic coordinates, which are corroborated by electrochemical measurements. By quantifying the structure-activity relationship, we discover a local environment descriptor to explain and predict the catalytic active sites at the atomic level. The ability to determine the 3D atomic structure and chemical species coupled with machine learning is expected to expand our fundamental understanding of a wide range of nanocatalysts.
△ Less
Submitted 18 February, 2022;
originally announced February 2022.
-
Real-time interactive 4D-STEM phase-contrast imaging from electron event representation data
Authors:
Philipp M. Pelz,
Ian Johnson,
Colin Ophus,
Peter Ercius,
Mary C. Scott
Abstract:
The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four dimensional-scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require…
▽ More
The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four dimensional-scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require data transmission rates and data storage capabilities that exceed commonly available computing infrastructure. Current commercial DEDs allow the user to make compromises in pixel bit depth, detector binning or windowing to reduce the per-frame file size and allow higher frame rates. This change in detector specifications requires decisions to be made before data acquisition that may reduce or lose information that could have been advantageous during data analysis. The 4D Camera, a DED with 87 kHz frame-rate developed at Lawrence Berkeley National Laboratory, reduces the raw data to a linear-index encoded electron event representation (EER). Here we show with experimental data from the 4D Camera that linear-index encoded EER and its direct use in 4D-STEM phase contrast imaging methods enables real-time, interactive phase-contrast from large-area 4D-STEM datasets. We detail the computational complexity advantages of the EER and the necessary computational steps to achieve real-time interactive ptychography and center-of-mass differential phase contrast using commonly available hardware accelerators.
△ Less
Submitted 13 April, 2021;
originally announced April 2021.
-
The Limits of Resolution and Dose for Aberration-Corrected Electron Tomography
Authors:
Reed Yalisove,
Suk Hyun Sung,
Peter Ercius,
Robert Hovden
Abstract:
Aberration-corrected electron microscopy can resolve the smallest atomic bond-lengths in nature. However, the high-convergence angles that enable spectacular resolution in 2D have unknown 3D resolution limits for all but the smallest objects ($< \sim$8nm). We show aberration-corrected electron tomography offers new limits for 3D imaging by measuring several focal planes at each specimen tilt. We p…
▽ More
Aberration-corrected electron microscopy can resolve the smallest atomic bond-lengths in nature. However, the high-convergence angles that enable spectacular resolution in 2D have unknown 3D resolution limits for all but the smallest objects ($< \sim$8nm). We show aberration-corrected electron tomography offers new limits for 3D imaging by measuring several focal planes at each specimen tilt. We present a theoretical foundation for aberration-corrected electron tomography by establishing analytic descriptions for resolution, sampling, object size, and dose---with direct analogy to the Crowther-Klug criterion. Remarkably, aberration-corrected scanning transmission electron tomography can measure complete 3D specimen structure of unbounded object sizes up to a specified cutoff resolution. This breaks the established Crowther limit when tilt increments are twice the convergence angle or smaller. Unprecedented 3D resolution is achievable across large objects. Atomic 3D imaging (1$\unicode{xC5}$) is allowed across extended objects larger than depth-of-focus (e.g. $>$ 20nm) using available microscopes and modest specimen tilting ($<$ 3$^\circ$). Furthermore, aberration-corrected tomography follows the rule of dose-fractionation where a specified total dose can be divided among tilts and defoci.
△ Less
Submitted 11 June, 2020;
originally announced June 2020.
-
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Authors:
Benjamin H Savitzky,
Lauren A Hughes,
Steven E Zeltmann,
Hamish G Brown,
Shiteng Zhao,
Philipp M Pelz,
Edward S Barnard,
Jennifer Donohue,
Luis Rangel DaCosta,
Thomas C. Pekin,
Ellis Kennedy,
Matthew T Janish,
Matthew M Schneider,
Patrick Herring,
Chirranjeevi Gopal,
Abraham Anapolsky,
Peter Ercius,
Mary Scott,
Jim Ciston,
Andrew M Minor,
Colin Ophus
Abstract:
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in…
▽ More
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the developing standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project.
△ Less
Submitted 20 March, 2020;
originally announced March 2020.
-
Probing Light Atoms at Sub-nanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography
Authors:
Fehmi S. Yasin,
Tyler R. Harvey,
Jordan J. Chess,
Jordan S. Pierce,
Colin Ophus,
Peter Ercius,
Benjamin J. McMorran
Abstract:
Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when illuminated with electrons. These issues have driven the development of TEM and STEM techniques that enable the structural analysis of electron beam-sensitive and weak…
▽ More
Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when illuminated with electrons. These issues have driven the development of TEM and STEM techniques that enable the structural analysis of electron beam-sensitive and weakly scattering nano-materials. Here, we demonstrate such a technique, STEM holography, capable of absolute phase and amplitude object wave measurement with respect to a vacuum reference wave. We use an amplitude-dividing nanofabricated grating to prepare multiple spatially separated electron diffraction probe beams focused at the sample plane, such that one beam transmits through the specimen while the others pass through vacuum. We raster-scan the diffracted probes over the region of interest. We configure the post specimen imaging system of the microscope to diffraction mode, overlapping the probes to form an interference pattern at the detector. Using a fast-readout, direct electron detector, we record and analyze the interference fringes at each position in a 2D raster scan to reconstruct the complex transfer function of the specimen, t(x). We apply this technique to image a standard target specimen consisting of gold nanoparticles on a thin amorphous carbon substrate, and demonstrate 2.4 angstrom resolution phase images. We find that STEM holography offers higher phase-contrast of the amorphous material while maintaining Au atomic lattice resolution when compared with high angle annular dark field STEM.
△ Less
Submitted 30 July, 2018;
originally announced August 2018.
-
Interpretable and efficient contrast in scanning transmission electron microscopy with a diffraction grating beamsplitter
Authors:
Tyler R. Harvey,
Fehmi S. Yasin,
Jordan J. Chess,
Jordan S. Pierce,
Roberto M. S. dos Reis,
Vasfi Burak Özdöl,
Peter Ercius,
Jim Ciston,
Wenchun Feng,
Nicholas A. Kotov,
Benjamin J. McMorran,
Colin Ophus
Abstract:
Efficient imaging of biomolecules, 2D materials and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope using a nanofabricated diffraction grating to produce multiple probe beams. The measured phase is more interpretable than phase-contrast scanning transmission electron microscop…
▽ More
Efficient imaging of biomolecules, 2D materials and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope using a nanofabricated diffraction grating to produce multiple probe beams. The measured phase is more interpretable than phase-contrast scanning transmission electron microscopy techniques without an off-axis reference wave, and the resolution could surpass that of off-axis electron holography. We apply the technique to image nanoparticles, carbon sub- strates and electric fields. The contrast observed in experiments agrees well with contrast predicted in simulations.
△ Less
Submitted 28 July, 2018;
originally announced August 2018.
-
Nanomaterial datasets to advance tomography in scanning transmission electron microscopy
Authors:
Barnaby D. A. Levin,
Elliot Padgett,
Chien-Chun Chen,
M. C. Scott,
Rui Xu,
Wolfgang Theis,
Yi Jiang,
Yongsoo Yang,
Colin Ophus,
Haitao Zhang,
Don-Hyung Ha,
Deli Wang,
Yingchao Yu,
Hector D. Abruna,
Richard D. Robinson,
Peter Ercius,
Lena F. Kourkoutis,
Jianwei Miao,
David A. Muller,
Robert Hovden
Abstract:
Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve resolution and reduce radiation dose requirements. This work presents five high-quality scanning transmission electron microscope (STEM) tomography datasets in ord…
▽ More
Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve resolution and reduce radiation dose requirements. This work presents five high-quality scanning transmission electron microscope (STEM) tomography datasets in order to address the critical need for open access data in this field. The datasets represent the current limits of experimental technique, are of high quality, and contain materials with structural complexity. Included are tomographic series of a hyperbranched Co2P nanocrystal, platinum nanoparticles on a carbon nanofibre imaged over the complete 180° tilt range, a platinum nanoparticle and a tungsten needle both imaged at atomic resolution by equal slope tomography, and a through-focal tilt series of PtCu nanoparticles. A volumetric reconstruction from every dataset is provided for comparison and development of post-processing and visualization techniques. Researchers interested in creating novel data processing and reconstruction algorithms will now have access to state of the art experimental test data.
△ Less
Submitted 9 June, 2016;
originally announced June 2016.
-
Breaking the Crowther Limit: Combining Depth-Sectioning and Tilt Tomography for High-Resolution, Wide-Field 3D Reconstructions
Authors:
Robert Hovden,
Peter Ercius,
Yi Jiang,
Deli Wang,
Yingchao Yu,
Hector D. Abruna,
Veit Elser,
David A. Muller
Abstract:
To date, high-resolution (< 1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by tomography. Further, the sub-Angstrom resolution of aberration-corrected electron microscopes is accompanied by a greatly diminished depth of field, causing regions…
▽ More
To date, high-resolution (< 1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by tomography. Further, the sub-Angstrom resolution of aberration-corrected electron microscopes is accompanied by a greatly diminished depth of field, causing regions of larger specimens (> 6 nm) to appear blurred or missing. Here we demonstrate a three-dimensional imaging method that overcomes both these limits by combining through-focal depth sectioning and traditional tilt-series tomography to reconstruct extended objects, with high-resolution, in all three dimensions. The large convergence angle in aberration corrected instruments now becomes a benefit and not a hindrance to higher quality reconstructions. A through-focal reconstruction over a 390 nm 3D carbon support containing over one hundred dealloyed and nanoporous PtCu catalyst particles revealed with sub-nanometer detail the extensive and connected interior pore structure that is created by the dealloying instability.
△ Less
Submitted 31 January, 2014;
originally announced February 2014.
-
Electron tomography at 2.4 Å resolution
Authors:
M. C. Scott,
Chien-Chun Chen,
Matthew Mecklenburg,
Chun Zhu,
Rui Xu,
Peter Ercius,
Ulrich Dahmen,
B. C. Regan,
Jianwei Miao
Abstract:
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 Å has been demonstrated(6). To reveal the 3D structure of thin samples…
▽ More
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 Å has been demonstrated(6). To reveal the 3D structure of thin samples, electron tomography is the method of choice(7-11), with resolutions of ~1 nm^3 currently achievable(10,11). Recently, discrete tomography has been used to generate a 3D atomic reconstruction of a silver nanoparticle 2-3 nm in diameter(12), but this statistical method assumes prior knowledge of the particle's lattice structure and requires that the atoms fit rigidly on that lattice. Here we report the experimental demonstration of a general electron tomography method that achieves atomic scale resolution without initial assumptions about the sample structure. By combining a novel projection alignment and tomographic reconstruction method with scanning transmission electron microscopy, we have determined the 3D structure of a ~10 nm gold nanoparticle at 2.4 Å resolution. While we cannot definitively locate all of the atoms inside the nanoparticle, individual atoms are observed in some regions of the particle and several grains are identified at three dimensions. The 3D surface morphology and internal lattice structure revealed are consistent with a distorted icosahedral multiply-twinned particle. We anticipate that this general method can be applied not only to determine the 3D structure of nanomaterials at atomic scale resolution(13-15), but also to improve the spatial resolution and image quality in other tomography fields(7,9,16-20).
△ Less
Submitted 5 February, 2012; v1 submitted 26 August, 2011;
originally announced August 2011.
