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The Adaptive Gain Integrating Pixel Detector at the European XFEL
Authors:
Aschkan Allahgholi,
Julian Becker,
Annette Delfs,
Roberto Dinapoli,
Peter Goettlicher,
Dominic Greiffenberg,
Beat Henrich,
Helmut Hirsemann,
Manuela Kuhn,
Robert Klanner,
Alexander Klyuev,
Hans Krueger,
Sabine Lange,
Torsten Laurus,
Alessandro Marras,
Davide Mezza,
Aldo Mozzanica,
Magdalena Niemann,
Jennifer Poehlsen,
Joern Schwandt,
Igor Sheviakov,
Xintian Shi,
Sergej Smoljanin,
Lothar Steffen,
Jolanta Sztuk-Dambietz
, et al. (7 additional authors not shown)
Abstract:
The Adaptive Gain Integrating Pixel Detector (AGIPD) is an x-ray imager, custom designed for the European x-ray Free-Electron Laser (XFEL). It is a fast, low noise integrating detector, with an adaptive gain amplifier per pixel. This has an equivalent noise of less than 1 keV when detecting single photons and, when switched into another gain state, a dynamic range of more than 10$^4$ photons of 12…
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The Adaptive Gain Integrating Pixel Detector (AGIPD) is an x-ray imager, custom designed for the European x-ray Free-Electron Laser (XFEL). It is a fast, low noise integrating detector, with an adaptive gain amplifier per pixel. This has an equivalent noise of less than 1 keV when detecting single photons and, when switched into another gain state, a dynamic range of more than 10$^4$ photons of 12 keV. In burst mode the system is able to store 352 images while running at up to 6.5 MHz, which is compatible with the 4.5 MHz frame rate at the European XFEL. The AGIPD system was installed and commissioned in August 2017, and successfully used for the first experiments at the Single Particles, Clusters and Biomolecules (SPB) experimental station at the European XFEL since September 2017. This paper describes the principal components and performance parameters of the system.
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Submitted 2 October, 2018; v1 submitted 1 August, 2018;
originally announced August 2018.
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Challenges for the Adaptive Gain Integrating Pixel Detector (AGIPD) design due to the high intensity photon radiation environment at the European XFEL
Authors:
J. Becker,
L. Bianco,
P. Göttlicher,
H. Graafsma,
H. Hirsemann,
S. Jack,
A. Klyuev,
S. Lange A. Marras,
U. Trunk,
R. Klanner,
J. Schwandt,
J. Zhang,
R. Dinapoli,
D. Greiffenberg,
B. Henrich,
A. Mozzanica,
B. Schmitt,
X. Shi,
M. Gronewald,
H. Krüger
Abstract:
The European X-ray Free Electron Laser (XFEL) is a new research facility currently under construction in Hamburg, Germany. With a pulse length of less than 100 fs and an extremely high luminosity of 27000 flashes per second the European XFEL will have a unique time structure that demands the development of new detectors tailored to the requirements imposed by the experiments while complying with t…
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The European X-ray Free Electron Laser (XFEL) is a new research facility currently under construction in Hamburg, Germany. With a pulse length of less than 100 fs and an extremely high luminosity of 27000 flashes per second the European XFEL will have a unique time structure that demands the development of new detectors tailored to the requirements imposed by the experiments while complying with the machine specific operation parameters. The Adaptive Gain Integrating Pixel Detector (AGIPD) is one response to the need for large 2D detectors, able to cope with the 4.5 MHz frame rate, as well as with the high dynamic range needed by XFEL experiments ranging from single photons to more than 10$^4$ 12 keV photons per pixel per pulse. In addition it has to withstand doses of up to 1 GGy over three years.
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Submitted 11 March, 2013;
originally announced March 2013.
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The single photon sensitivity of the Adaptive Gain Integrating Pixel Detector
Authors:
Julian Becker,
Dominic Greiffenberg,
Ulrich Trunk,
Xintian Shi,
Roberto Dinapoli,
Aldo Mozzanica,
Beat Henrich,
Bernd Schmitt,
Heinz Graafsma
Abstract:
Single photon sensitivity is an important property of certain detection systems. This work investigated the single photon sensitivity of the Adaptive Gain Integrating Pixel Detector (AGIPD) and its dependence on possible detector noise values. Due to special requirements at the European X-ray Free Electron Laser (XFEL) the AGIPD finds the number of photons absorbed in each pixel by integrating the…
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Single photon sensitivity is an important property of certain detection systems. This work investigated the single photon sensitivity of the Adaptive Gain Integrating Pixel Detector (AGIPD) and its dependence on possible detector noise values. Due to special requirements at the European X-ray Free Electron Laser (XFEL) the AGIPD finds the number of photons absorbed in each pixel by integrating the total signal. Photon counting is done off line on a thresholded data set.
It was shown that AGIPD will be sensitive to single photons of 8 keV energy or more (detection efficiency $\gg$ 50%, less than 1 count due to noise per 10$^6$ pixels). Should the final noise be at the lower end of the possible range (200 - 400 electrons) single photon sensitivity can also be achieved at 5 keV beam energy.
It was shown that charge summing schemes are beneficial when the noise is sufficiently low. The total detection rate of events is increased and the probability to count a single event multiple times in adjacent pixels is reduced by a factor of up to 40.
The entry window of AGIPD allows 3 keV photons to reach the sensitive volume with approximately 70% probability. Therefore the low energy performance of AGIPD was explored, finding a maximum noise floor below 0.035 hits/pixel/frame at 3 keV beam energy. Depending on the noise level and selected threshold this value can be reduced by a factor of approximately 10. Even though single photon sensitivity, as defined in this work, is not given, imaging at this energy is still possible, allowing Poisson noise limited performance for signals significantly above the noise floor.
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Submitted 23 July, 2012; v1 submitted 27 March, 2012;
originally announced March 2012.
