py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Authors:
Benjamin H Savitzky,
Lauren A Hughes,
Steven E Zeltmann,
Hamish G Brown,
Shiteng Zhao,
Philipp M Pelz,
Edward S Barnard,
Jennifer Donohue,
Luis Rangel DaCosta,
Thomas C. Pekin,
Ellis Kennedy,
Matthew T Janish,
Matthew M Schneider,
Patrick Herring,
Chirranjeevi Gopal,
Abraham Anapolsky,
Peter Ercius,
Mary Scott,
Jim Ciston,
Andrew M Minor,
Colin Ophus
Abstract:
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in…
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Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the developing standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project.
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Submitted 20 March, 2020;
originally announced March 2020.
2W/nm Peak-power All-Fiber Supercontinuum Source and its Application to the Characterization of Periodically Poled Nonlinear Crystals
Authors:
B. A. Cumberland,
J. C. Travers,
R. E. Kennedy,
S. V. Popov,
J. R. Taylor
Abstract:
We demonstrate a uniform high spectral brightness and peak power density all-fiber supercontinuum source. The source consists of a nanosecond Ytterbium fiber laser and an optimal length PCF producing a continuum with a peak power density of 2 W/nm and less than 5 dB of spectral variation between 590 to 1500 nm. The Watt level per nm peak power density enables the use of such sources for the char…
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We demonstrate a uniform high spectral brightness and peak power density all-fiber supercontinuum source. The source consists of a nanosecond Ytterbium fiber laser and an optimal length PCF producing a continuum with a peak power density of 2 W/nm and less than 5 dB of spectral variation between 590 to 1500 nm. The Watt level per nm peak power density enables the use of such sources for the characterization of nonlinear materials. Application of the source is demonstrated with the characterization of several periodically poled crystals.
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Submitted 13 April, 2007; v1 submitted 7 March, 2007;
originally announced March 2007.
