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In-Situ Measurements of the Secondary Electron Yield in an Accelerator Environment: Instrumentation and Methods
Authors:
W. H. Hartung,
D. M. Asner,
J. V. Conway,
C. A. Dennett,
S. Greenwald,
J. -S. Kim,
Y. Li,
T. P. Moore,
V. Omanovic,
M. A. Palmer,
C. R. Strohman
Abstract:
The performance of a particle accelerator can be limited by the build-up of an electron cloud (EC) in the vacuum chamber. Secondary electron emission from the chamber walls can contribute to EC growth. An apparatus for in-situ measurements of the secondary electron yield (SEY) in the Cornell Electron Storage Ring (CESR) was developed in connection with EC studies for the CESR Test Accelerator prog…
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The performance of a particle accelerator can be limited by the build-up of an electron cloud (EC) in the vacuum chamber. Secondary electron emission from the chamber walls can contribute to EC growth. An apparatus for in-situ measurements of the secondary electron yield (SEY) in the Cornell Electron Storage Ring (CESR) was developed in connection with EC studies for the CESR Test Accelerator program. The CESR in-situ system, in operation since 2010, allows for SEY measurements as a function of incident electron energy and angle on samples that are exposed to the accelerator environment, typically 5.3 GeV counter-rotating beams of electrons and positrons. The system was designed for periodic measurements to observe beam conditioning of the SEY with discrimination between exposure to direct photons from synchrotron radiation versus scattered photons and cloud electrons. The samples can be exchanged without venting the CESR vacuum chamber. Measurements have been done on metal surfaces and EC-mitigation coatings. The in-situ SEY apparatus and improvements to the measurement tools and techniques are described.
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Submitted 10 December, 2014;
originally announced December 2014.
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Report on Instrumentation and Methods for In-Situ Measurements of the Secondary Electron Yield in an Accelerator Environment
Authors:
W. H. Hartung,
D. M. Asner,
J. V. Conway,
C. A. Dennett,
S. Greenwald,
J. -S. Kim,
Y. Li,
T. P. Moore,
V. Omanovic,
M. A. Palmer,
C. R. Strohman
Abstract:
The achievable beam current and beam quality of a particle accelerator can be limited by the build-up of an electron cloud (EC) in the vacuum chamber. Secondary electron emission from the walls of the vacuum chamber can contribute to the growth of the electron cloud. An apparatus for in-situ measurements of the secondary electron yield (SEY) of samples in the vacuum chamber of the Cornell Electron…
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The achievable beam current and beam quality of a particle accelerator can be limited by the build-up of an electron cloud (EC) in the vacuum chamber. Secondary electron emission from the walls of the vacuum chamber can contribute to the growth of the electron cloud. An apparatus for in-situ measurements of the secondary electron yield (SEY) of samples in the vacuum chamber of the Cornell Electron Storage Ring (CESR) has been developed in connection with EC studies for the CESR Test Accelerator program (CesrTA). The CesrTA in-situ system, in operation since 2010, allows for SEY measurements as a function of incident electron energy and angle on samples that are exposed to the accelerator environment, typically 5.3 GeV counter-rotating beams of electrons and positrons. The system was designed for periodic measurements to observe beam conditioning of the SEY with discrimination between exposure to direct photons from synchrotron radiation versus scattered photons and cloud electrons. The SEY chambers can be isolated from the CESR beam pipe, allowing us to exchange samples without venting the CESR vacuum chamber. Measurements so far have been on metal surfaces and EC-mitigation coatings. The goal of the SEY measurement program is to improve predictive models for EC build-up and EC-induced beam effects. This report describes the CesrTA in-situ SEY apparatus, the measurement tool and techniques, and iterative improvements therein.
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Submitted 8 December, 2014; v1 submitted 2 July, 2014;
originally announced July 2014.
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Secondary Electron Yield Measurements of Fermilab's Main Injector Vacuum Vessel
Authors:
D. J. Scott,
D. Capista,
K. L. Duel,
R. M. Zwaska,
S. Greenwald,
W. Hartung,
Y. Li,
T. P. Moore,
M. A. Palmer,
R. Kirby,
M. Pivi,
L. Wang
Abstract:
We discuss the progress made on a new installation in Fermilab's Main Injector that will help investigate the electron cloud phenomenon by making direct measurements of the secondary electron yield (SEY) of samples irradiated in the accelerator. In the Project X upgrade the Main Injector will have its beam intensity increased by a factor of three compared to current operations. This may result in…
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We discuss the progress made on a new installation in Fermilab's Main Injector that will help investigate the electron cloud phenomenon by making direct measurements of the secondary electron yield (SEY) of samples irradiated in the accelerator. In the Project X upgrade the Main Injector will have its beam intensity increased by a factor of three compared to current operations. This may result in the beam being subject to instabilities from the electron cloud. Measured SEY values can be used to further constrain simulations and aid our extrapolation to Project X intensities. The SEY test-stand, developed in conjunction with Cornell and SLAC, is capable of measuring the SEY from samples using an incident electron beam when the samples are biased at different voltages. We present the design and manufacture of the test-stand and the results of initial laboratory tests on samples prior to installation.
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Submitted 29 January, 2013;
originally announced January 2013.
