-
Uncovering the Three-Dimensional Structure of Upconverting Core-Shell Nanoparticles with Multislice Electron Ptychography
Authors:
Stephanie M. Ribet,
Georgios Varnavides,
Cassio C. S. Pedroso,
Bruce E. Cohen,
Peter Ercius,
Mary C. Scott,
Colin Ophus
Abstract:
In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but contrast, dose, and projection limitations make conventional imaging modes insufficient for fully characterizing these structures. Phase retrieval methods provi…
▽ More
In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but contrast, dose, and projection limitations make conventional imaging modes insufficient for fully characterizing these structures. Phase retrieval methods provide a promising alternative imaging mode, and in particular, multislice electron ptychography can recover depth-dependent information. Here, we study beam-sensitive photon upconverting core-shell nanoparticles with a multislice ptychography approach using a low electron dose to avoid damage. Large strain fields arise in these heterostructures due to the mismatch in lattice parameter between the core and the shell. We reconstruct both a nanoparticle that appears defect-free and one that has a large break in the side and map the distribution of strain in 3D by computing distortion fields from high-resolution potential images of each slice. In the defect-free nanoparticle, we observe twisting of the shell, while in the broken nanoparticle we measure the 3D position of the crack, the core, and dislocations. These results highlight the advantage of multislice electron ptychography to recover 3D information from a single scan, even under strict electron dose requirements from beam-sensitive samples.
△ Less
Submitted 15 February, 2024;
originally announced February 2024.
-
High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography
Authors:
Andrey Romanov,
Min Gee Cho,
Mary Cooper Scott,
Colin Ophus,
Philipp Pelz
Abstract:
Resolving single atoms in large-scale volumes has been a goal for atomic resolution microscopy for a long time. Electron microscopy has come close to this goal using a combination of advanced electron optics and computational imaging algorithms. However, atomic-resolution 3D imaging in volumes larger than the depth of field limit of the electron optics has so far been out of reach. Electron ptycho…
▽ More
Resolving single atoms in large-scale volumes has been a goal for atomic resolution microscopy for a long time. Electron microscopy has come close to this goal using a combination of advanced electron optics and computational imaging algorithms. However, atomic-resolution 3D imaging in volumes larger than the depth of field limit of the electron optics has so far been out of reach. Electron ptychography, a computational imaging method allowing to solve the multiple-scattering problem from position- and momentum-resolved measurements, provides the opportunity to surpass this limit. Here, we experimentally demonstrate atomic resolution three-dimensional phase-contrast imaging in a volume surpassing the depth of field limits using multi-slice ptychographic electron tomography. We reconstruct tilt-series 4D-STEM measurements of a Co3O4 nanocube, yielding 1.75 Å resolution in a reconstructed volume of (18.2nm)^3.
△ Less
Submitted 5 November, 2023;
originally announced November 2023.
-
The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Authors:
Peter Ercius,
Ian J. Johnson,
Philipp Pelz,
Benjamin H. Savitzky,
Lauren Hughes,
Hamish G. Brown,
Steven E. Zeltmann,
Shang-Lin Hsu,
Cassio C. S. Pedroso,
Bruce E. Cohen,
Ramamoorthy Ramesh,
David Paul,
John M. Joseph,
Thorsten Stezelberger,
Cory Czarnik,
Matthew Lent,
Erin Fong,
Jim Ciston,
Mary C. Scott,
Colin Ophus,
Andrew M. Minor,
and Peter Denes
Abstract:
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700…
▽ More
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10 - 700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 - 300 keV. Through electron counting, the resulting sparse data sets are reduced in size by 10 - 300x compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex 4D-STEM experiments to be accomplished with typical STEM scanning parameters.
△ Less
Submitted 19 May, 2023;
originally announced May 2023.
-
Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography
Authors:
Philipp M Pelz,
Sinead Griffin,
Scott Stonemeyer,
Derek Popple,
Hannah Devyldere,
Peter Ercius,
Alex Zettl,
Mary C Scott,
Colin Ophus
Abstract:
Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined using phase-contrast single-particle cryo-electron microscopy from thousands of identical proteins, and reconstructions have rea…
▽ More
Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology and materials science. In structural biology, three-dimensional structures of proteins are routinely determined using phase-contrast single-particle cryo-electron microscopy from thousands of identical proteins, and reconstructions have reached atomic resolution for specific proteins. In materials science, three-dimensional atomic structures of complex nanomaterials have been determined using a combination of annular dark field (ADF) scanning transmission electron microscopic (STEM) tomography and subpixel localization of atomic peaks, in a method termed atomic electron tomography (AET). However, neither of these methods can determine the three-dimensional atomic structure of heterogeneous nanomaterials containing light elements. Here, we perform mixed-state electron ptychography from 34.5 million diffraction patterns to reconstruct a high-resolution tilt series of a double wall-carbon nanotube (DW-CNT), encapsulating a complex $\mathrm{ZrTe}$ sandwich structure. Class averaging of the resulting reconstructions and subpixel localization of the atomic peaks in the reconstructed volume reveals the complex three-dimensional atomic structure of the core-shell heterostructure with 17 picometer precision. From these measurements, we solve the full $\mathrm{Zr_{11}Te_{50}}$ structure, which contains a previously unobserved $\mathrm{ZrTe_{2}}$ phase in the core. The experimental realization of ptychographic atomic electron tomography (PAET) will allow for structural determination of a wide range of nanomaterials which are beam-sensitive or contain light elements.
△ Less
Submitted 17 June, 2022;
originally announced June 2022.
-
Simultaneous Successive Twinning Captured by Atomic Electron Tomography
Authors:
Phillip M. Pelz,
Catherine K. Groschner,
Alexandra Bruefach,
Adam Satariano,
Colin Ophus,
M. C. Scott
Abstract:
Shape-controlled synthesis of multiply twinned nanostructures is heavily emphasized in nanoscience, in large part due to the desire to control the size, shape, and terminating facets of metal nanoparticles for applications in catalysis. Direct control of the size and shape of solution-grown nanoparticles relies on an understanding of how synthetic parameters alter nanoparticle structures during sy…
▽ More
Shape-controlled synthesis of multiply twinned nanostructures is heavily emphasized in nanoscience, in large part due to the desire to control the size, shape, and terminating facets of metal nanoparticles for applications in catalysis. Direct control of the size and shape of solution-grown nanoparticles relies on an understanding of how synthetic parameters alter nanoparticle structures during synthesis. However, while outcome populations can be effectively studied with standard electron microscopy methods, transient structures that appear during some synthetic routes are difficult to study using conventional high resolution imaging methods due to the high complexity of the 3D nanostructures. Here, we have studied the prevalence of transient structures during growth of multiply twinned particles and employed atomic electron tomography to reveal the atomic-scale three dimensional structure of a Pd nanoparticle undergoing a shape transition. By identifying over 20,000 atoms within the structure and classifying them according to their local crystallographic environment, we observe a multiply-twinned structure consistent with a simultaneous successive twinning from a decahedral to icosahedral structure. We also observe a high degree of structural disorder in the nanoparticle, and a disordered crystal structure on the particle surface. Our results shed light on the transition mechanism for formation of icosahedral nanoparticle structures.
△ Less
Submitted 14 September, 2021;
originally announced September 2021.
-
Real-time interactive 4D-STEM phase-contrast imaging from electron event representation data
Authors:
Philipp M. Pelz,
Ian Johnson,
Colin Ophus,
Peter Ercius,
Mary C. Scott
Abstract:
The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four dimensional-scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require…
▽ More
The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four dimensional-scanning transmission electron microscopy (4D-STEM). DED frame rates approaching 100 kHz require data transmission rates and data storage capabilities that exceed commonly available computing infrastructure. Current commercial DEDs allow the user to make compromises in pixel bit depth, detector binning or windowing to reduce the per-frame file size and allow higher frame rates. This change in detector specifications requires decisions to be made before data acquisition that may reduce or lose information that could have been advantageous during data analysis. The 4D Camera, a DED with 87 kHz frame-rate developed at Lawrence Berkeley National Laboratory, reduces the raw data to a linear-index encoded electron event representation (EER). Here we show with experimental data from the 4D Camera that linear-index encoded EER and its direct use in 4D-STEM phase contrast imaging methods enables real-time, interactive phase-contrast from large-area 4D-STEM datasets. We detail the computational complexity advantages of the EER and the necessary computational steps to achieve real-time interactive ptychography and center-of-mass differential phase contrast using commonly available hardware accelerators.
△ Less
Submitted 13 April, 2021;
originally announced April 2021.
-
A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations
Authors:
Philipp M Pelz,
Alexander Rakowski,
Luis Rangel DaCosta,
Benjamin H Savitzky,
Mary C Scott,
Colin Ophus
Abstract:
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multislice algorithm to perform these simulations can require extremely large calculation times, particularly for experiments with millions of probe positi…
▽ More
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the conventional multislice algorithm to perform these simulations can require extremely large calculation times, particularly for experiments with millions of probe positions as each probe position must be simulated independently. Recently, the PRISM algorithm was developed to reduce calculation times for large STEM simulations. Here, we introduce a new method for STEM simulation: partitioning of the STEM probe into "beamlets," given by a natural neighbor interpolation of the parent beams. This idea is compatible with PRISM simulations and can lead to even larger improvements in simulation time, as well requiring significantly less computer RAM. We have performed various simulations to demonstrate the advantages and disadvantages of partitioned PRISM STEM simulations. We find that this new algorithm is particularly useful for 4D-STEM simulations of large fields of view. We also provide a reference implementation of the multislice, PRISM and partitioned PRISM algorithms.
△ Less
Submitted 3 April, 2021;
originally announced April 2021.
-
Nanomaterial datasets to advance tomography in scanning transmission electron microscopy
Authors:
Barnaby D. A. Levin,
Elliot Padgett,
Chien-Chun Chen,
M. C. Scott,
Rui Xu,
Wolfgang Theis,
Yi Jiang,
Yongsoo Yang,
Colin Ophus,
Haitao Zhang,
Don-Hyung Ha,
Deli Wang,
Yingchao Yu,
Hector D. Abruna,
Richard D. Robinson,
Peter Ercius,
Lena F. Kourkoutis,
Jianwei Miao,
David A. Muller,
Robert Hovden
Abstract:
Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve resolution and reduce radiation dose requirements. This work presents five high-quality scanning transmission electron microscope (STEM) tomography datasets in ord…
▽ More
Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve resolution and reduce radiation dose requirements. This work presents five high-quality scanning transmission electron microscope (STEM) tomography datasets in order to address the critical need for open access data in this field. The datasets represent the current limits of experimental technique, are of high quality, and contain materials with structural complexity. Included are tomographic series of a hyperbranched Co2P nanocrystal, platinum nanoparticles on a carbon nanofibre imaged over the complete 180° tilt range, a platinum nanoparticle and a tungsten needle both imaged at atomic resolution by equal slope tomography, and a through-focal tilt series of PtCu nanoparticles. A volumetric reconstruction from every dataset is provided for comparison and development of post-processing and visualization techniques. Researchers interested in creating novel data processing and reconstruction algorithms will now have access to state of the art experimental test data.
△ Less
Submitted 9 June, 2016;
originally announced June 2016.
-
Reply to "Local Filtering Fundamentally Against Wide Spectrum"
Authors:
Jianwei Miao,
M. C. Scott,
Chien-Chun Chen,
Chun Zhu,
Edward R. White,
Chin-Yi Chiu,
B. C. Regan,
Yu Huang,
Laurence D. Marks
Abstract:
After carefully studying the comment by Wang et al. (arXiv:1408.6420), we found it includes several mistakes and unjustified statements and Wang et al. lack very basic knowledge of dislocations. Moreover, there is clear evidence indicating that Wang et al. significantly misrepresented our method and claimed something that they actually did not implement.
After carefully studying the comment by Wang et al. (arXiv:1408.6420), we found it includes several mistakes and unjustified statements and Wang et al. lack very basic knowledge of dislocations. Moreover, there is clear evidence indicating that Wang et al. significantly misrepresented our method and claimed something that they actually did not implement.
△ Less
Submitted 2 September, 2014;
originally announced September 2014.
-
Electron tomography at 2.4 Å resolution
Authors:
M. C. Scott,
Chien-Chun Chen,
Matthew Mecklenburg,
Chun Zhu,
Rui Xu,
Peter Ercius,
Ulrich Dahmen,
B. C. Regan,
Jianwei Miao
Abstract:
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 Å has been demonstrated(6). To reveal the 3D structure of thin samples…
▽ More
Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial resolution and image quality in TEM have been significantly improved(4,5) and resolution below 0.5 Å has been demonstrated(6). To reveal the 3D structure of thin samples, electron tomography is the method of choice(7-11), with resolutions of ~1 nm^3 currently achievable(10,11). Recently, discrete tomography has been used to generate a 3D atomic reconstruction of a silver nanoparticle 2-3 nm in diameter(12), but this statistical method assumes prior knowledge of the particle's lattice structure and requires that the atoms fit rigidly on that lattice. Here we report the experimental demonstration of a general electron tomography method that achieves atomic scale resolution without initial assumptions about the sample structure. By combining a novel projection alignment and tomographic reconstruction method with scanning transmission electron microscopy, we have determined the 3D structure of a ~10 nm gold nanoparticle at 2.4 Å resolution. While we cannot definitively locate all of the atoms inside the nanoparticle, individual atoms are observed in some regions of the particle and several grains are identified at three dimensions. The 3D surface morphology and internal lattice structure revealed are consistent with a distorted icosahedral multiply-twinned particle. We anticipate that this general method can be applied not only to determine the 3D structure of nanomaterials at atomic scale resolution(13-15), but also to improve the spatial resolution and image quality in other tomography fields(7,9,16-20).
△ Less
Submitted 5 February, 2012; v1 submitted 26 August, 2011;
originally announced August 2011.
