The quality assurance test of the SliT ASIC for the J-PARC muon $g-2$/EDM experiment
Authors:
Takashi Yamanaka,
Yoichi Fujita,
Eitaro Hamada,
Tetsuichi Kishishita,
Tsutomu Mibe,
Yutaro Sato,
Yoshiaki Seino,
Masayoshi Shoji,
Taikain Suehara,
Manobu M. Tanaka,
Junji Tojo,
Keisuke Umebayashi,
Tamaki Yoshioka
Abstract:
The SliT ASIC is a readout chip for the silicon strip detector to be used at the J-PARC muon $g-2$/EDM experiment. The production version of SliT128D was designed and mass production was finished. A quality assurance test method for bare SliT128D chips was developed to provide a sufficient number of chips for the experiment. The quality assurance test of the SliT128D chips was performed and 5735 c…
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The SliT ASIC is a readout chip for the silicon strip detector to be used at the J-PARC muon $g-2$/EDM experiment. The production version of SliT128D was designed and mass production was finished. A quality assurance test method for bare SliT128D chips was developed to provide a sufficient number of chips for the experiment. The quality assurance test of the SliT128D chips was performed and 5735 chips were inspected. No defect was observed in chips of 84.3%. Accepting a few channels with poor time walk performance out of 128 channels per chip, more than 90% yield can be achieved, which is sufficient to construct the whole detector.
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Submitted 22 January, 2024;
originally announced January 2024.
