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Nuclear dynamics of singlet exciton fission: a direct observation in pentacene single crystals
Authors:
Hélène Seiler,
Marcin Krynski,
Daniela Zahn,
Sebastian Hammer,
Yoav William Windsor,
Thomas Vasileiadis,
Jens Pflaum,
Ralph Ernstorfer,
Mariana Rossi,
Heinrich Schwoerer
Abstract:
Singlet exciton fission (SEF) is a key process in the development of efficient opto-electronic devices. An aspect that is rarely probed directly, and yet has a tremendous impact on SEF properties, is the nuclear structure and dynamics involved in this process. Here we directly observe the nuclear dynamics accompanying the SEF process in single crystal pentacene using femtosecond electron diffracti…
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Singlet exciton fission (SEF) is a key process in the development of efficient opto-electronic devices. An aspect that is rarely probed directly, and yet has a tremendous impact on SEF properties, is the nuclear structure and dynamics involved in this process. Here we directly observe the nuclear dynamics accompanying the SEF process in single crystal pentacene using femtosecond electron diffraction. The data reveal coherent atomic motions at 1 THz, incoherent motions, and an anisotropic lattice distortion representing the polaronic character of the triplet excitons. Combining molecular dynamics simulations, time-dependent density functional theory and experimental structure factor analysis, the coherent motions are identified as collective sliding motions of the pentacene molecules along their long axis. Such motions modify the excitonic coupling between adjacent molecules. Our findings reveal that long-range motions play a decisive part in the disintegration of the electronically correlated triplet pairs, and shed light on why SEF occurs on ultrafast timescales.
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Submitted 24 November, 2020;
originally announced November 2020.
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A quantitative comparison of time-of-flight momentum microscopes and hemispherical analyzers for time- and angle-resolved photoemission spectroscopy experiments
Authors:
J. Maklar,
S. Dong,
S. Beaulieu,
T. Pincelli,
M. Dendzik,
Y. W. Windsor,
R. P. Xian,
M. Wolf,
R. Ernstorfer,
L. Rettig
Abstract:
Time-of-flight-based momentum microscopy has a growing presence in photoemission studies, as it enables parallel energy- and momentum-resolved acquisition of the full photoelectron distribution. Here, we report table-top extreme ultraviolet (XUV) time- and angle-resolved photoemission spectroscopy (trARPES) featuring both a hemispherical analyzer and a momentum microscope within the same setup. We…
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Time-of-flight-based momentum microscopy has a growing presence in photoemission studies, as it enables parallel energy- and momentum-resolved acquisition of the full photoelectron distribution. Here, we report table-top extreme ultraviolet (XUV) time- and angle-resolved photoemission spectroscopy (trARPES) featuring both a hemispherical analyzer and a momentum microscope within the same setup. We present a systematic comparison of the two detection schemes and quantify experimentally relevant parameters, including pump- and probe-induced space-charge effects, detection efficiency, photoelectron count rates, and depth of focus. We highlight the advantages and limitations of both instruments based on exemplary trARPES measurements of bulk WSe2. Our analysis demonstrates the complementary nature of the two spectrometers for time-resolved ARPES experiments. Their combination in a single experimental apparatus allows us to address a broad range of scientific questions with trARPES.
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Submitted 14 December, 2020; v1 submitted 13 August, 2020;
originally announced August 2020.
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Soft x-ray absorption of thin films detected using substrate luminescence: A performance analysis
Authors:
Cinthia Piamonteze,
Yoav William Windsor,
Sridhar R. V. Avula,
Eugenie Kirk,
Urs Staub
Abstract:
X-ray absorption spectroscopy of thin films is central to a broad range of scientific fields, and is typically detected using indirect techniques. X-ray excited optical luminescence (XEOL) from the sample's substrate is one such detection method, in which the luminescence signal acts as an effective transmission measurement through the film. This detection method has several advantages that make i…
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X-ray absorption spectroscopy of thin films is central to a broad range of scientific fields, and is typically detected using indirect techniques. X-ray excited optical luminescence (XEOL) from the sample's substrate is one such detection method, in which the luminescence signal acts as an effective transmission measurement through the film. This detection method has several advantages that make it versatile compared to others, in particular for insulating samples or when a probing depth larger than 10nm is required. In this work we present a systematic performance analysis of this method with the aim of providing guidelines for its advantages and pitfalls, enabling a wider use of this method by the thin film community. We compare and quantify the efficiency of XEOL from a range of commonly used substrates. Our measurements demonstrate the equivalence between XEOL and x-ray transmission measurements for thin films. Moreover, we show the applicability of XEOL to magnetic studies by employing XMCD sum rules with XEOL-generated data. Lastly, we demonstrate that above a certain thickness XEOL shows a saturation-like effect, which can be modelled and corrected for.
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Submitted 2 April, 2020;
originally announced April 2020.
