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ORCIDCharles R. Kime
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1990 – 1999
- 1997
[j21]Danial J. Neebel, Charles R. Kime:
Cellular Automata for Weighted Random Pattern Generation. IEEE Trans. Computers 46(11): 1219-1229 (1997)- 1996
- [c16]Mohammed F. AlShaibi, Charles R. Kime:
MFBIST: A BIST Method for Random Pattern Resistant Circuits. ITC 1996: 176-185 - 1995
- [j20]Kee Sup Kim, Charles R. Kime:
Partial scan flip-flop selection by use of empirical testability. J. Electron. Test. 7(1-2): 47-59 (1995) - 1994
- [c15]Mohammed F. AlShaibi, Charles R. Kime:
Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits. ITC 1994: 929-938 - [c14]Danial J. Neebel, Charles R. Kime:
Multiple weighted cellular automata. VTS 1994: 81-86 - [c13]Byung S. So, Charles R. Kime:
ICAT: incremental combinational ATPG. VTS 1994: 106-113 - 1993
- [j19]Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja:
A Tutorial on Built-in Self-Test. I. Principles. IEEE Des. Test Comput. 10(1): 73-82 (1993) - [j18]Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja:
A Tutorial on Built-In Self-Test, Part 2: Applications. IEEE Des. Test Comput. 10(2): 69-77 (1993) - [j17]Byung S. So, Charles R. Kime:
A fault simulation method: Parallel pattern critical path tracing. J. Electron. Test. 4(3): 255-265 (1993) - [c12]Kee Sup Kim, Charles R. Kime:
Partial Scan Using Reverse Direction Empirical Testability. ITC 1993: 498-506 - [c11]Danial J. Neebel, Charles R. Kime:
Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation. ITC 1993: 1013-1022 - 1992
- [j16]John Y. Sayah, Charles R. Kime:
Test Scheduling in High Performance VLSI System Implementations. IEEE Trans. Computers 41(1): 52-67 (1992) - 1990
- [c10]Kee Sup Kim, Charles R. Kime:
Partial Scan by Use of Empirical Testability. ICCAD 1990: 314-317 - [c9]Chau-Chin Su, Charles R. Kime:
Multiple path sensitization for hierarchical circuit testing. ITC 1990: 152-161 - [c8]Chau-Chin Su, Charles R. Kime:
Computer-aided design of pseudoexhaustive BIST for semiregular circuits. ITC 1990: 680-689
1980 – 1989
- 1989
- [c7]John Y. Sayah, Charles R. Kime:
Scheduling unequal length tests in high performance VLSI system implementations. ICCD 1989: 566-570 - 1988
- [j15]Gary L. Craig, Charles R. Kime, Kewal K. Saluja:
Test Scheduling and Control for VLSI Built-In Self-Test. IEEE Trans. Computers 37(9): 1099-1109 (1988) - [j14]Kewal K. Saluja, Rajiv Sharma, Charles R. Kime:
A concurrent testing technique for digital circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(12): 1250-1260 (1988) - [c6]Charles R. Kime:
Impact of Testability Standards on University Research and Instruction. ITC 1988: 199-200 - [c5]John Y. Sayah, Charles R. Kime:
: Test Scheduling for High Performance VLSI System Implementations. ITC 1988: 421-430 - [c4]Leon J. Sigal, Charles R. Kime:
Concurrent Off-Phase Built-in Self-Test of Dormant Logic. ITC 1988: 934-941 - 1985
- [c3]Gary L. Craig, Charles R. Kime:
Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. ITC 1985: 126-139 - 1984
- [j13]John A. McPherson, Charles R. Kime:
Diagnosis in the Presence of Known Faults. IEEE Trans. Computers 33(10): 943-947 (1984) - [c2]Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams:
A Built-In Test Methodology for VLSI Data Paths. ITC 1984: 327-337 - 1982
- [c1]Vincent C. Rideout, J. Eastman, Adel Said Elmaghraby, Raphael A. Finkel, A. A. Frank, T. J. Kaminsky, Charles R. Kime, John A. McPherson, Michael Jon Redmond, S. Diane Smith:
WISPAC: A Parallel Array Computer for Simulation Applications. IMACS World Congress 1982: 159-169
1970 – 1979
- 1979
- [j12]John A. McPherson, Charles R. Kime:
A Two-Level Diagnostic Model for Digital Systems. IEEE Trans. Computers 28(1): 16-27 (1979) - [j11]Charles R. Kime:
An Abstract Model for Digital System Fault Diagnosis. IEEE Trans. Computers 28(10): 754-767 (1979) - 1976
- [j10]Ramachendra P. Batni, Charles R. Kime:
A Module-Level Testing Approach for Combinational Networks. IEEE Trans. Computers 25(6): 594-604 (1976) - 1975
- [j9]Gernot Metze, Donald R. Schertz, Kilin To, Gordon Whitney, Charles R. Kime, Jeffrey D. Russell:
Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences". IEEE Trans. Computers 24(1): 108 (1975) - [j8]Charles R. Kime:
Fault Tolerant Computing: An Introduction and a Perspective. IEEE Trans. Computers 24(5): 457-460 (1975) - [j7]Jeffrey D. Russell, Charles R. Kime:
System Fault Diagnosis: Closure and Diagnosability with Repair. IEEE Trans. Computers 24(11): 1078-1089 (1975) - [j6]Jeffrey D. Russell, Charles R. Kime:
System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair. IEEE Trans. Computers 24(12): 1155-1161 (1975) - 1974
- [j5]Ramachendra P. Batni, Jeffrey D. Russell, Charles R. Kime:
An Efficient Algorithm for Finding an Irredundant Set Cover. J. ACM 21(3): 351-355 (1974) - 1972
- [j4]James C. Bassett, Charles R. Kime:
Improved Procedures for Determining Diagnostic Resolution. IEEE Trans. Computers 21(4): 385-388 (1972) - 1971
- [j3]Jeffrey D. Russell, Charles R. Kime:
Structural Factors in the Fault Diagnosis of Combinational Networks. IEEE Trans. Computers 20(11): 1276-1285 (1971) - 1970
- [j2]Charles R. Kime:
An Analysis Model for Digital System Diagnosis. IEEE Trans. Computers 19(11): 1063-1073 (1970)
1960 – 1969
- 1966
- [j1]Charles R. Kime:
An organization for checking experiments on sequential circuits. IEEE Trans. Electron. Comput. 15(1): 113-115 (1966)
Coauthor Index
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