Smart Metrology: Difference between revisions
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*The available (''[[A priori and a posteriori|a priori]]'') information is used by applying advanced statistical approaches, such as [[Bayesian inference]], for monitoring and is used in the decision-making process.<ref name=":1">{{Cite journal|last1=Pou|first1=Jean-Michel|last2=Leblond|first2=Laurent|date=2018|title=ISO / IEC guide 98-4: A copernican revolution for metrology|url=https://ieeexplore.ieee.org/document/8515699|journal=IEEE Instrumentation & Measurement Magazine|volume=21|issue=5|pages=6–10|doi=10.1109/MIM.2018.8515699|s2cid=53232687 |issn=1094-6969|url-access=subscription}}</ref><ref name=":4">{{Cite book|last1=Ferrero|first1=Alessandro|last2=Salicone|first2=Simona|last3=Jetti|first3=Harsha Vardhana|title=19th International Congress of Metrology (CIM2019) |chapter=Bayesian approach to uncertainty evaluation: Is it always working? |editor-first1=Sandrine |editor-last1=Gazal |date=2019|url=https://cfmetrologie.edpsciences.org/articles/metrology/abs/2019/01/metrology_cim2019_16002/metrology_cim2019_16002.html|language=en|publisher=EDP Sciences|pages=16002|doi=10.1051/metrology/201916002|isbn=978-2-7598-9069-9|doi-access=free}}</ref> |
*The available (''[[A priori and a posteriori|a priori]]'') information is used by applying advanced statistical approaches, such as [[Bayesian inference]], for monitoring and is used in the decision-making process.<ref name=":1">{{Cite journal|last1=Pou|first1=Jean-Michel|last2=Leblond|first2=Laurent|date=2018|title=ISO / IEC guide 98-4: A copernican revolution for metrology|url=https://ieeexplore.ieee.org/document/8515699|journal=IEEE Instrumentation & Measurement Magazine|volume=21|issue=5|pages=6–10|doi=10.1109/MIM.2018.8515699|s2cid=53232687 |issn=1094-6969|url-access=subscription}}</ref><ref name=":4">{{Cite book|last1=Ferrero|first1=Alessandro|last2=Salicone|first2=Simona|last3=Jetti|first3=Harsha Vardhana|title=19th International Congress of Metrology (CIM2019) |chapter=Bayesian approach to uncertainty evaluation: Is it always working? |editor-first1=Sandrine |editor-last1=Gazal |date=2019|url=https://cfmetrologie.edpsciences.org/articles/metrology/abs/2019/01/metrology_cim2019_16002/metrology_cim2019_16002.html|language=en|publisher=EDP Sciences|pages=16002|doi=10.1051/metrology/201916002|isbn=978-2-7598-9069-9|doi-access=free}}</ref> |
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* The calibration intervals were not at fixed intervals. |
* The calibration intervals were not at fixed intervals. |
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==See also== |
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{{Main|Outline of metrology and measurement}} |
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* [[Dimensional metrology]] |
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* [[Forensic metrology]] |
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* [[Time metrology]] |
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* [[Quantum metrology]] |
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== References == |
== References == |
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Latest revision as of 08:29, 20 January 2024
 | This article contains content that is written like an advertisement. (December 2023) |
Smart Metrology is a modern approach to industrial metrology. The name was introduced by Jean-Michel Pou and Laurent Leblond, a French meteorologist and a French statistician. The term was coined in their book, La Smart Metrology: De la métrologie des instruments à la métrologie des décisions.[1] It was then adopted by Deltamu, a French company providing services in the field of industrial metrology.
The approach promoted by Smart Metrology applies the exploitation of data and information, including that provided by big data,[2] to implement an approach based on the three pillars of metrology[3] (uncertainty,[4] calibration and traceability) in industrial applications.[5]
Approach[edit]
The approach suggested by Smart Metrology is fully framed within the ISO 9001 recommendations. Usual metrology is often regarded as a pure cost and is actually not following the ISO 9001 quality standards.
Innovation[edit]
Smart Metrology[1] follows a different approach according to the following steps:
- The measuring equipment is monitored using historical and relevant data to detect whether a doubt exists. If such a doubt exists, the equipment is calibrated.
- The available (a priori) information is used by applying advanced statistical approaches, such as Bayesian inference, for monitoring and is used in the decision-making process.[6][7]
- The calibration intervals were not at fixed intervals.
See also[edit]
References[edit]
- ^ a b Pou, Jean-Michel. (2016). La smart metrology : de la métrologie des instruments à la métrologie des décisions. Leblond, Laurent, (19 ... – ... ; expert en statistique industrielle), Nordon, Didier. La Plaine Saint-Denis: AFNOR Editions. ISBN 978-2-12-465545-8. OCLC 952466728.
- ^ Mari, Luca; Petri, Dario (2017). "The metrological culture in the context of big data: managing data-driven decision confidence". IEEE Instrumentation & Measurement Magazine. 20 (5): 4–20. doi:10.1109/MIM.2017.8036688. ISSN 1094-6969. S2CID 19784029.
- ^ Ferrero, Alessandro (2015). "The pillars of metrology". IEEE Instrumentation & Measurement Magazine. 18 (6): 7–11. doi:10.1109/MIM.2015.7335771. hdl:11311/984646. ISSN 1094-6969. S2CID 20051541.
- ^ JCGM 100:2008, Evaluation of measurement data — Guide to the expression of uncertainty in measurement, 2008, https://www.bipm.org/utils/common/documents/jcgm/JCGM_100_2008_E.pdf
- ^ Lazzari, Annarita; Pou, Jean-Michel; Dubois, Christophe; Leblond, Laurent (2017). "Smart metrology: the importance of metrology of decisions in the big data era". IEEE Instrumentation & Measurement Magazine. 20 (6): 22–29. doi:10.1109/MIM.2017.8121947. ISSN 1094-6969. S2CID 22216034.
- ^ Pou, Jean-Michel; Leblond, Laurent (2018). "ISO / IEC guide 98-4: A copernican revolution for metrology". IEEE Instrumentation & Measurement Magazine. 21 (5): 6–10. doi:10.1109/MIM.2018.8515699. ISSN 1094-6969. S2CID 53232687.
- ^ Ferrero, Alessandro; Salicone, Simona; Jetti, Harsha Vardhana (2019). "Bayesian approach to uncertainty evaluation: Is it always working?". In Gazal, Sandrine (ed.). 19th International Congress of Metrology (CIM2019). EDP Sciences. p. 16002. doi:10.1051/metrology/201916002. ISBN 978-2-7598-9069-9.